default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDJacob A. Abraham
Person information
- affiliation: University of Texas at Austin, USA
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
showing all ?? records
2020 – today
- 2023
[c328]Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee, Jacob A. Abraham:
Secure Control Loop Execution of Cyber-Physical Devices Using Predictive State Space Checks. ISQED 2023: 1-8- 2022
- [j113]Laith Mohammad Abualigah
, Mohammad Shehab, Ali Diabat, Jacob A. Abraham:
Selection scheme sensitivity for a hybrid Salp Swarm Algorithm: analysis and applications. Eng. Comput. 38(2): 1149-1175 (2022) - 2021
- [j112]Phuoc Pham, Jacob A. Abraham, Jaeyong Chung:
Training Multi-Bit Quantized and Binarized Networks with a Learnable Symmetric Quantizer. IEEE Access 9: 47194-47203 (2021) - [j111]Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham:
A Current and Temperature Limiting System in a 7-nm Hexagon™ Compute Digital Signal Processor. IEEE J. Solid State Circuits 56(3): 814-823 (2021) - [j110]Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham:
A Proactive System for Voltage-Droop Mitigation in a 7-nm Hexagon™ Processor. IEEE J. Solid State Circuits 56(4): 1166-1175 (2021) - [j109]Suvadeep Banerjee, Balavinayagam Samynathan, Jacob A. Abraham, Abhijit Chatterjee:
Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding. IEEE Trans. Dependable Secur. Comput. 18(2): 576-592 (2021) - [i3]Phuoc Pham, Jacob A. Abraham, Jaeyong Chung:
Training Multi-bit Quantized and Binarized Networks with A Learnable Symmetric Quantizer. CoRR abs/2104.00210 (2021) - 2020
- [j108]Byoungho Kim, Jacob A. Abraham:
Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters. IEEE Access 8: 7851-7860 (2020) - [c327]Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham:
Randomized Pulse-Modulating Instruction-Issue Control Circuit for a Current and Temperature Limiting System in a 7nm Hexagon™ Compute DSP. CICC 2020: 1-4 - [c326]Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob A. Abraham:
Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor. ITC 2020: 1-10 - [c325]Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham:
A Proactive Voltage-Droop-Mitigation System in a 7nm Hexagon™ Processor. VLSI Circuits 2020: 1-2
2010 – 2019
- 2019
- [j107]Jie Fang, Chaoming Zhang, Frank Singor, Jacob A. Abraham:
A Broadband CMOS RF Front End for Direct Sampling Satellite Receivers. IEEE J. Solid State Circuits 54(8): 2140-2148 (2019) - [j106]Byoungho Kim, Jacob A. Abraham:
Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications. IEEE Trans. Ind. Electron. 66(1): 586-594 (2019) - [c324]Eric Cheng, Daniel Mueller-Gritschneder, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Deming Chen, Hyungmin Cho, Yanjing Li, Uzair Sharif, Kevin Skadron, Mircea Stan, Ulf Schlichtmann, Subhasish Mitra:
Cross-Layer Resilience: Challenges, Insights, and the Road Ahead. DAC 2019: 198 - [c323]Jacob A. Abraham:
Resiliency Demands on Next Generation Critical Embedded Systems. IOLTS 2019: 135-138 - 2018
- [j105]Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra:
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1839-1852 (2018) - [c322]Ameya Chaudhari, Jacob A. Abraham:
Effective Control Flow Integrity Checks for Intrusion Detection. IOLTS 2018: 103-108 - [c321]Ninghan Tian, Daniel G. Saab, Jacob A. Abraham:
ESIFT: Efficient System for Error Injection. IOLTS 2018: 201-206 - [c320]Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee:
Cross-Layer Control Adaptation for Autonomous System Resilience. IOLTS 2018: 261-264 - 2017
- [j104]Jie Fang, Shankar Thirunakkarasu, Xuefeng Yu, Fabian Silva-Rivas, Chaoming Zhang, Frank Singor, Jacob A. Abraham:
A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(7): 1673-1683 (2017) - [c319]Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra:
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD 2017: 593-596 - [c318]Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee:
Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. IOLTS 2017: 192-195 - [c317]Vijay Kiran Kalyanam, Peter G. Sassone, Jacob A. Abraham:
Power prediction of embedded scalar and vector processor: Challenges and solutions. ISQED 2017: 221-228 - [c316]Tong Zhang, Daniel G. Saab, Jacob A. Abraham:
Automatic Assertion Generation for Simulation, Formal Verification and Emulation. ISVLSI 2017: 471-476 - [i2]Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra:
Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). CoRR abs/1709.09921 (2017) - 2016
- [j103]Immanuel Raja, Gaurab Banerjee, Mohamad A. Zeidan, Jacob A. Abraham:
A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1975-1983 (2016) - [c315]Shih-Hsin Hu, Jacob A. Abraham:
Quality Aware Error Detection in 2-D Separable Linear Transformation. ATS 2016: 257-262 - [c314]Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra:
Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. DAC 2016: 68:1-68:6 - [c313]Jacob A. Abraham:
Cross-layer resilience: are high-level techniques always better? HLDVT 2016: 78 - [c312]Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC 2016: 1-10 - [c311]Harini Bhamidipati, Daniel G. Saab, Jacob A. Abraham:
Single Trojan injection model generation and detection. LATS 2016: 181 - [c310]Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Checksum based error detection in linearized representations of non linear control systems. LATS 2016: 182 - [c309]Jacob A. Abraham, Abhijit Chatterjee:
Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. VLSID 2016: 1-2 - [c308]Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker:
Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. VTS 2016: 1-2 - [i1]Eric Cheng, Shahrzad Mirkhani, Lukasz G. Szafaryn, Chen-Yong Cher, Hyungmin Cho, Kevin Skadron, Mircea R. Stan, Klas Lilja, Jacob A. Abraham, Pradip Bose, Subhasish Mitra:
CLEAR: Cross-Layer Exploration for Architecting Resilience - Combining Hardware and Software Techniques to Tolerate Soft Errors in Processor Cores. CoRR abs/1604.03062 (2016) - 2015
- [j102]Hsun-Cheng Lee, Jacob A. Abraham:
Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction. J. Electron. Test. 31(2): 127-138 (2015) - [j101]Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham:
Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Trans. Electron. 98-C(10): 991-994 (2015) - [c307]Shahrzad Mirkhani, Subhasish Mitra, Chen-Yong Cher, Jacob A. Abraham:
Efficient soft error vulnerability estimation of complex designs. DATE 2015: 103-108 - [c306]Gregory Ford, Aswin Krishna, Jacob A. Abraham, Daniel G. Saab:
Formal Verification ATPG Search Engine Emulator (Abstract Only). FPGA 2015: 264 - [c305]Vijay Kiran Kalyanam, Martin Saint-Laurent, Jacob A. Abraham:
Power-aware multi-voltage custom memory models for enhancing RTL and low power verification. ICCD 2015: 24-31 - [c304]Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian:
The future of fault tolerant computing. IOLTS 2015: 108-109 - [c303]Jacob A. Abraham, Abhijit Chatterjee:
Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. VLSID 2015: 6-7 - [c302]Shahrzad Mirkhani, Balavinayagam Samynathan, Jacob A. Abraham:
In-depth soft error vulnerability analysis using synthetic benchmarks. VTS 2015: 1-6 - 2014
- [j100]Marc Snir, Robert W. Wisniewski, Jacob A. Abraham, Sarita V. Adve, Saurabh Bagchi, Pavan Balaji, James F. Belak, Pradip Bose, Franck Cappello, Bill Carlson, Andrew A. Chien, Paul Coteus, Nathan DeBardeleben, Pedro C. Diniz, Christian Engelmann, Mattan Erez, Saverio Fazzari, Al Geist, Rinku Gupta, Fred Johnson, Sriram Krishnamoorthy, Sven Leyffer, Dean Liberty, Subhasish Mitra, Todd S. Munson, Rob Schreiber, Jon Stearley, Eric Van Hensbergen:
Addressing failures in exascale computing. Int. J. High Perform. Comput. Appl. 28(2): 129-173 (2014) - [j99]Byoungho Kim, Jacob A. Abraham:
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits. IEEE Trans. Circuits Syst. II Express Briefs 61-II(5): 329-333 (2014) - [j98]Byoungho Kim, Jacob A. Abraham:
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. IEEE Trans. Circuits Syst. II Express Briefs 61-II(10): 743-747 (2014) - [c301]Shahrzad Mirkhani, Hyungmin Cho, Subhasish Mitra, Jacob A. Abraham:
Rethinking error injection for effective resilience. ASP-DAC 2014: 390-393 - [c300]Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham:
Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS 2014: 39-44 - [c299]Hsun-Cheng Lee, Jacob A. Abraham:
A novel low power 11-bit hybrid ADC using flash and delay line architectures. DATE 2014: 1-4 - [c298]Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn:
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE 2014: 1-8 - [c297]Shakeel S. Abdulla, Haewoon Nam, Jacob A. Abraham:
A novel algorithm for sparse FFT pruning and its applications to OFDMA technology. IPCCC 2014: 1-7 - [c296]Shahrzad Mirkhani, Jacob A. Abraham:
EAGLE: A regression model for fault coverage estimation using a simulation based metric. ITC 2014: 1-10 - [c295]Hsun-Cheng Lee, Jacob A. Abraham:
Harmonic distortion correction for 8-bit delay line ADC using gray code. LATW 2014: 1-4 - [c294]Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda:
Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? VTS 2014: 1-2 - [c293]Shahrzad Mirkhani, Jacob A. Abraham:
Fast evaluation of test vector sets using a simulation-based statistical metric. VTS 2014: 1-6 - 2013
- [j97]Byoungho Kim, Jacob A. Abraham:
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 60-II(5): 257-261 (2013) - [j96]Mohamad A. Zeidan, Gaurab Banerjee, Jacob A. Abraham:
Asynchronous Measurement of Transient Phase-Shift Resulting From RF Receiver State-Change. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(10): 2740-2751 (2013) - [j95]Jaeyong Chung, Joonsung Park, Jacob A. Abraham:
A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 281-291 (2013) - [j94]Jaeyong Chung, Jacob A. Abraham:
Concurrent Path Selection Algorithm in Statistical Timing Analysis. IEEE Trans. Very Large Scale Integr. Syst. 21(9): 1715-1726 (2013) - [c292]Hsun-Cheng Lee, Jacob A. Abraham:
Digital Calibration for 8-Bit Delay Line ADC Using Harmonic Distortion Correction. Asian Test Symposium 2013: 128-133 - [c291]Hyungmin Cho, Shahrzad Mirkhani, Chen-Yong Cher, Jacob A. Abraham, Subhasish Mitra:
Quantitative evaluation of soft error injection techniques for robust system design. DAC 2013: 101:1-101:10 - [c290]Junyoung Park, Ameya Chaudhari, Jacob A. Abraham:
Non-speculative double-sampling technique to increase energy-efficiency in a high-performance processor. DATE 2013: 254-257 - [c289]Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Real-time checking of linear control systems using analog checksums. IOLTS 2013: 122-127 - [c288]Vinod Viswanath, Rajeev Muralidhar, Harinarayanan Seshadri, Jacob A. Abraham:
On a rewriting strategy for dynamically managing power constraints and power dissipation in SoCs. ISQED 2013: 128-134 - [c287]Mahesh Prabhu, Jacob A. Abraham:
Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults. ITC 2013: 1-7 - [c286]Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham:
Dynamic Trace Signal Selection for Post-Silicon Validation. VLSI Design 2013: 302-307 - [c285]Ameya Chaudhari, Junyoung Park, Jacob A. Abraham:
A framework for low overhead hardware based runtime control flow error detection and recovery. VTS 2013: 1-6 - [c284]Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham:
Enhanced algorithm of combining trace and scan signals in post-silicon validation. VTS 2013: 1-6 - [c283]Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas:
Special session 12B: Panel post-silicon validation & test in huge variance era. VTS 2013: 1 - 2012
- [j93]Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham:
Built-in Self Test of RF Subsystems with Integrated Detectors. J. Electron. Test. 28(5): 557-569 (2012) - [j92]Hyunjin Kim, Jacob A. Abraham:
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and Measurement. J. Electron. Test. 28(5): 585-597 (2012) - [j91]Sachin Dileep Dasnurkar, Jacob A. Abraham:
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing. J. Electron. Test. 28(5): 697-704 (2012) - [j90]Xiao Pu, Krishnaswamy Nagaraj, Jacob A. Abraham, Axel Thomsen:
A Novel fractional-n PLL Based on a Simple Reference Multiplier. J. Circuits Syst. Comput. 21(6) (2012) - [j89]Vinod Viswanath, Jacob A. Abraham:
Automatic and Correct Register Transfer Level Annotations for Low Power Microprocessor Design. J. Low Power Electron. 8(4): 424-439 (2012) - [j88]Baker Mohammad, Jacob A. Abraham:
A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory. Microelectron. J. 43(2): 110-118 (2012) - [j87]Jaeyong Chung, Jacob A. Abraham:
Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 485-496 (2012) - [j86]Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham:
Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 497-508 (2012) - [j85]Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham:
Testability-Driven Statistical Path Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(8): 1275-1287 (2012) - [j84]Jaeyong Chung, Jacob A. Abraham:
On Computing Criticality in Refactored Timing Graphs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(12): 1935-1939 (2012) - [j83]Mohamad A. Zeidan, Gaurab Banerjee, Ranjit Gharpurey, Jacob A. Abraham:
Phase-Aware Multitone Digital Signal Based Test for RF Receivers. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(9): 2097-2110 (2012) - [j82]Byoungho Kim, Jacob A. Abraham:
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 59-II(11): 785-789 (2012) - [c282]Hyunjin Kim, Jacob A. Abraham:
On-chip source synchronous interface timing test scheme with calibration. DATE 2012: 1146-1149 - [c281]Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Indirect method for random jitter measurement on SoCs using critical path characterization. ETS 2012: 1-6 - [c280]Mahesh Prabhu, Jacob A. Abraham:
Functional test generation for hard to detect stuck-at faults using RTL model checking. ETS 2012: 1-6 - [c279]Ameya Chaudhari, Jacob A. Abraham:
Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors. IOLTS 2012: 162-167 - [c278]Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow:
FALCON: Rapid statistical fault coverage estimation for complex designs. ITC 2012: 1-10 - [c277]Junyoung Park, H. Mert Ustun, Jacob A. Abraham:
Run-time Prediction of the Optimal Performance Point in DVS-based Dynamic Thermal Management. VLSI Design 2012: 155-160 - [c276]Hyunjin Kim, Jacob A. Abraham:
A Built-In Self-Test scheme for DDR memory output timing test and measurement. VTS 2012: 7-12 - [c275]Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham:
An oscillation-based test structure for timing information extraction. VTS 2012: 74-79 - [c274]Ji Hwan (Paul) Chun, Siew Mooi Lim, Shao Chee Ong, Jae Wook Lee, Jacob A. Abraham:
Test of phase interpolators in high speed I/Os using a sliding window search. VTS 2012: 134-139 - [c273]Junyoung Park, Jacob A. Abraham:
An aging-aware flip-flop design based on accurate, run-time failure prediction. VTS 2012: 294-299 - 2011
- [j81]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27(3): 321-334 (2011) - [j80]Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham:
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27(4): 429-439 (2011) - [j79]Ramtilak Vemu, Jacob A. Abraham:
CEDA: Control-Flow Error Detection Using Assertions. IEEE Trans. Computers 60(9): 1233-1245 (2011) - [j78]Byoungho Kim, Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(8): 1773-1784 (2011) - [j77]Byoungho Kim, Jacob A. Abraham:
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. IEEE Trans. Instrum. Meas. 60(6): 2014-2024 (2011) - [c272]Joonsoo Kim, Joonsoo Lee, Jacob A. Abraham:
System accuracy estimation of SRAM-based device authentication. ASP-DAC 2011: 37-42 - [c271]Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham:
Path criticality computation in parameterized statistical timing analysis. ASP-DAC 2011: 249-254 - [c270]Tung-Yeh Wu, Shih-Hsin Hu, Jacob A. Abraham:
Robust power gating reactivation by dynamic wakeup sequence throttling. ASP-DAC 2011: 615-620 - [c269]Hyunjin Kim, Jacob A. Abraham:
On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. Asian Test Symposium 2011: 15-20 - [c268]Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham:
Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium 2011: 232-237 - [c267]Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham:
Testability driven statistical path selection. DAC 2011: 417-422 - [c266]Junyoung Park, Jacob A. Abraham:
A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems. ISLPED 2011: 391-396 - [c265]Jacob A. Abraham:
Tutorial: "Manufacturing test of systems-on-a-chip (SoCs)". SoCC 2011: 272 - [c264]Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham:
Efficient and product-representative timing model validation. VTS 2011: 90-95 - 2010
- [j76]Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electron. Test. 26(1): 73-86 (2010) - [j75]Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham:
On-Chip Delay Measurement Based Response Analysis for Timing Characterization. J. Electron. Test. 26(6): 599-619 (2010) - [c263]Ji Hwan (Paul) Chun, Jae Wook Lee, Jacob A. Abraham:
A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. ASP-DAC 2010: 312-317 - [c262]Hyunjin Kim, Jacob A. Abraham:
A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces. Asian Test Symposium 2010: 123-128 - [c261]Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274 - [c260]Sachin Dileep Dasnurkar, Jacob A. Abraham:
Calibration-enabled scalable built-in current sensor compatible with very low cost ATE. ETS 2010: 119-124 - [c259]