ISQED 2010: San Jose, California, USA

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SRAM Manufacturability

Mixed Signal and Power Control Circuits

Guaranteeing Timing Performance

Analog Design For Reliability

Lithography & Manufacturing

Power Aware Memory Design

Poster Session 1

Variability: Design, Test, and Characterization

Emerging Device and Design Technniques

Power and Performance Issues in System-Level Design

Poster Session 2

Parametric and Delay Test


Advances in Power Distribution, Placement and Routing

Aging Analysis & Mitigation

Test, Quality, Cost and Debug

System-level NoC, SoC and ASIC design

Clocking Strategy for Modern Low Power Multi-Core & Structured ASICs

Modeling and Analysis of Temperature and Power