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"Selective-run built-in self-test using an embedded processor."

Sungbae Hwang, Jacob A. Abraham (2002)

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DOI: 10.1145/505306.505333

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/glvlsi/HwangA02
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Sungbae Hwang, Jacob A. Abraham:
Selective-run built-in self-test using an embedded processor. ACM Great Lakes Symposium on VLSI 2002: 124-129

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