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ORCID"Delay Defect Diagnosis Methodology Using Path Delay Measurements."
Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham (2015)
- Eun Jung Jang, Jaeyong Chung
, Jacob A. Abraham:
Delay Defect Diagnosis Methodology Using Path Delay Measurements. IEICE Trans. Electron. 98-C(10): 991-994 (2015)
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