"A Built-In Self-Test scheme for DDR memory output timing test and measurement."

Hyunjin Kim, Jacob A. Abraham (2012)

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DOI: 10.1109/VTS.2012.6231072

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Hyunjin Kim, Jacob A. Abraham:
A Built-In Self-Test scheme for DDR memory output timing test and measurement. VTS 2012: 7-12

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