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"Characterization and Testing of Physical Failures in MOS Logic Circuits."

Prithviraj Banerjee, Jacob A. Abraham (1984)

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DOI: 10.1109/MDT.1984.5005655

access: closed

type: Journal Article

metadata version: 2020-11-11

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Prithviraj Banerjee, Jacob A. Abraham:
Characterization and Testing of Physical Failures in MOS Logic Circuits. IEEE Des. Test 1(3): 76-86 (1984)

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