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"Practical Test and DFT for Next Generation VLSI."

Jacob A. Abraham, Gopi Ganapathy (1996)

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DOI: 10.1109/VLSID.1996.10011

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/AbrahamG96
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/AbrahamG96
Jacob A. Abraham, Gopi Ganapathy:
Practical Test and DFT for Next Generation VLSI. VLSI Design 1996: 3

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