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Bill Eklow
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2010 – 2019
- 2016
- [j7]Bill Eklow:
Recap of the ITC15 Test Conference. IEEE Des. Test 33(1): 85-86 (2016) - [j6]Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow:
A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 309-322 (2016) - 2015
- [c32]Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz:
No Fault Found: The root cause. VTS 2015: 1 - 2014
- [j5]Ran Wang, Krishnendu Chakrabarty, Bill Eklow:
Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9): 1410-1423 (2014) - [c31]Mehdi Sadi, Zoe Conroy, Bill Eklow, Matthias Kamm, Nematollah Bidokhti, Mark Mohammad Tehranipoor:
An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs. ATS 2014: 269-274 - [c30]Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow:
A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs. ITC 2014: 1-10 - [c29]J. K. Jerry Lee, Amr Haggag, William Eklow:
Protecting against emerging vmin failures in advanced technology nodes. ITC 2014: 1-7 - 2013
- [j4]Li Jiang, Qiang Xu, Bill Eklow:
On Effective Through-Silicon Via Repair for 3-D-Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(4): 559-571 (2013) - [c28]Ran Wang, Krishnendu Chakrabarty, Bill Eklow:
Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs. Asian Test Symposium 2013: 147-152 - [c27]Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow:
On effective and efficient in-field TSV repair for stacked 3D ICs. DAC 2013: 74:1-74:6 - 2012
- [j3]Bill Eklow:
Managing Complex Boundary-Scan Operations. IEEE Des. Test Comput. 29(2): 100-102 (2012) - [c26]Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow:
Yield enhancement for 3D-stacked ICs: Recent advances and challenges. ASP-DAC 2012: 731-737 - [c25]Li Jiang, Qiang Xu, Bill Eklow:
On effective TSV repair for 3D-stacked ICs. DATE 2012: 793-798 - [c24]Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson:
Re-using chip level DFT at board level. ETS 2012: 1 - [c23]Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow:
FALCON: Rapid statistical fault coverage estimation for complex designs. ITC 2012: 1-10 - 2011
- [j2]Bill Eklow:
Major Milestones for Two IEEE Standards Groups in 2011. IEEE Des. Test Comput. 28(6): 85-87 (2011) - [e2]Bill Eklow, R. D. (Shawn) Blanton:
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-0153-5 [contents]
2000 – 2009
- 2009
- [c22]Luca Amati, Cristiana Bolchini, Laura Frigerio, Fabio Salice, William Eklow, Arnold Suvatne, Eugenio Brambilla, Federico Franzoso, Michele Martin:
An Incremental Approach to Functional Diagnosis. DFT 2009: 392-400 - [e1]Gordon W. Roberts, Bill Eklow:
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE Computer Society 2009, ISBN 978-1-4244-4868-5 [contents] - 2008
- [c21]Brice Achkir, Pavel Zivny, Bill Eklow:
Parametric Testing of Optical Interfaces. ITC 2008: 1 - [c20]John Malian, Bill Eklow:
Embedded Testing in an In-Circuit Test Environment. ITC 2008: 1-6 - 2006
- [c19]Bill Eklow, Ben Bennetts:
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). ETS 2006: 253-254 - [c18]Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8 - [c17]Sylvain Tourangeau, Bill Eklow:
Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. ITC 2006: 1-9 - 2005
- [c16]Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow:
A practical perspective on reducing ASIC NTFs. ITC 2005: 7 - [c15]Bill Eklow:
An update on IEEE 1149.6 - successes and issues. ITC 2005: 7 - [c14]Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow:
Optimized reasoning-based diagnosis for non-random, board-level, production defects. ITC 2005: 7 - [c13]Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts:
IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8 - 2004
- [c12]Bill Eklow:
IP Testing - The Future Differentiator? DATE 2004: 6-9 - [c11]Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts:
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191 - [c10]Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533 - [c9]Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau:
Simulation Based System Level Fault Insertion Using Co-verification Tools. ITC 2004: 704-710 - [c8]Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein:
"Real Life" System Testing of Networking Equipment. ITC 2004: 1072-1077 - [c7]Bill Eklow:
What Do You Mean My Board Test Stinks? ITC 2004: 1423 - 2003
- [j1]Bill Eklow, Carl Barnhart, Kenneth P. Parker:
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. 20(5): 76-83 (2003) - [c6]Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz:
IEEE 1149.6 - A Practical Perspective. ITC 2003: 494-502 - 2002
- [c5]Bill Eklow, Carl Barnhart, Kenneth P. Parker:
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065 - [c4]Bill Eklow:
Is Board Test Worth Talking About? ITC 2002: 1235 - 2001
- [c3]William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo:
Unsafe board states during PC-based boundary-scan testing. ITC 2001: 615-623
1990 – 1999
- 1998
- [c2]Bulent I. Dervisoglu, Mike Ricchetti, William Eklow:
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. ITC 1998: 980-989 - 1994
- [c1]William Eklow:
Optimizing Boundary Scan in a Proprietary Environment. ITC 1994: 1024
Coauthor Index
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