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"Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded ..."

Vijay Kiran Kalyanam et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325271

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob A. Abraham:
Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded Processor. ITC 2020: 1-10

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