DFT 2003: Boston, MA, USA

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Yield and Defects


Fault Analysis, Injection & Simulation

Test & Diagnosis

Current Test & Diagnosis

Test Generation & Application

Scan Design & Test


Error Correcting Codes

Invited Talk

Analogue & Mixed Signal Test

Defect Tolerance and Testing

FPGA & Memory Test

Design Verification & Synthesis

SoC & Core Test

System Reliability

Fault Tolerance

Soft Errors

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