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"A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge ..."

Hyunjin Kim et al. (2010)

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DOI: 10.1109/ETSYM.2010.5512766

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo:
A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. ETS 2010: 145-150

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