ETS 2010: Prague, Czech Republic

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Plenary Presentations

Embedded Tutorials

3D and Multi-Core Test


Post-Silicon Debug and Diagnosis

Memory Test

Fault Detection, Tolerance and Identification

Delay Analysis

Advanced Test Infrastructure

Resistive Bridges and Opens


Advanced ADC Testing

Design Validation, Test and Debug of Complex Systems

Innovative Techniques for Highly Reliable Microprocessor-Based Systems

Fault Tolerance and Online Testing

Fault Diagnosis


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