DFT 2006: Arlington, Virginia, USA

Invited Talk

Adaptive Design and Gate Level Redundancy

Delay Test

Emerging Technologies

Test Compression

Invited Talk

Defect Tolerance and Error Correction

BIST and Pseudo-Functional Test

Reliability Evaluation and Analysis

Approaches for Soft Errors

Interactive Papers


Defect and Fault Tolerance in Sensors and NOCs

Test Techniques

Processor Checking and Jitter

Fault Tolerance Designs

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