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"Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights."

Eric Cheng et al. (2017)

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DOI: 10.1109/ICCD.2017.103

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iccd/ChengABBCCCCLLM17
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  persistent URL:
  - https://dblp.org/rec/conf/iccd/ChengABBCCCCLLM17
Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Q. Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra:
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. ICCD 2017: 593-596

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