ITC 1985: Philadelphia, PA, USA

Invited Speekers

Session 1: Test Economics

Session 2: Test Generation System Directions - I

Session 3: Design and Analysis Of Input Stimulus Generation for Built-In-Self Test

Session 4: Systems Test

Session 5: Test Equipment: Calibration and Timing Accuracy

Session 6: Test Technologie in the University

Session 8: Automatic Test Program Generation Techniques

Session 9: Test Generation System Directons - II

Session 10: New Developments in Built-In-Self-Test

Session 11: Non - Traditional Board Testing

Session 12: VLSI Test Systems - Solution to Specific Problems

Session 13: Momory Test - The Changing Scene

Session 14: Test Generation and Design Verification Techniques

Session 15: Quality/ Reliability

Session 16: Disign for Testability

Session 17: The Tester Interface: Board Testing and Chip Probing

Session 18A: Tester Interfaces / Debug Tolls

Session 18B: Test Software Standards

Session 19: Logic Simulation and Simulation Models

Session 20: Microprocessor / VLSI Test I

Session 21: Testability Analysis

Session 22: Advanced Testing Techniques: Analog Devices and Systems

Session 23: Artificial Intelligence Applications to Test

Session 24: Microprocessor / VLSI Test II

Session 25A: IC Process and Test Data Management

Session 25B: Printed Circuit Board Manufacturing Process

a service of Schloss Dagstuhl - Leibniz Center for Informatics