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2020 – today
- 2020
[j13]Byoungho Kim
, Jacob A. Abraham:
Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters. IEEE Access 8: 7851-7860 (2020)
2010 – 2019
- 2019
- [j12]Byoungho Kim, Jacob A. Abraham:
Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications. IEEE Trans. Ind. Electron. 66(1): 586-594 (2019) - 2016
- [j11]Byoungho Kim:
Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications. IEEE Trans. Circuits Syst. II Express Briefs 63-II(2): 121-125 (2016) - [j10]Ilseop Lee, Byoungho Kim, Byung-Geun Lee:
A Low-Power Incremental Delta-Sigma ADC for CMOS Image Sensors. IEEE Trans. Circuits Syst. II Express Briefs 63-II(4): 371-375 (2016) - 2015
- [j9]Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee:
Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron. IEEE Trans. Ind. Electron. 62(4): 2410-2419 (2015) - [j8]Myonglae Chu, Byoungho Kim, Byung-Geun Lee:
A 10-bit 200-MS/s Zero-Crossing-Based Pipeline ADC in 0.13-µm CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 23(11): 2671-2675 (2015) - 2014
- [j7]Byoungho Kim, Jacob A. Abraham:
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits. IEEE Trans. Circuits Syst. II Express Briefs 61-II(5): 329-333 (2014) - [j6]Byoungho Kim, Jacob A. Abraham:
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. IEEE Trans. Circuits Syst. II Express Briefs 61-II(10): 743-747 (2014) - 2013
- [j5]Byoungho Kim, Jacob A. Abraham:
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 60-II(5): 257-261 (2013) - 2012
- [j4]Byoungho Kim, Jacob A. Abraham:
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 59-II(11): 785-789 (2012) - 2011
- [j3]Byoungho Kim, Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(8): 1773-1784 (2011) - [j2]Byoungho Kim, Jacob A. Abraham:
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. IEEE Trans. Instrum. Meas. 60(6): 2014-2024 (2011)
2000 – 2009
- 2008
- [c4]Byoungho Kim, Nash Khouzam, Jacob A. Abraham:
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. VTS 2008: 293-298 - 2007
- [j1]Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Predicting mixed-signal dynamic performance using optimised signature-based alternate test. IET Comput. Digit. Tech. 1(3): 159-169 (2007) - [c3]Byoungho Kim, Zhenhai Fu, Jacob A. Abraham:
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. VTS 2007: 291-296 - 2006
- [c2]Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. ETS 2006: 199-204 - [c1]Hongjoong Shin, Byoungho Kim, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS 2006: 412-419
Coauthor Index
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