15th IOLTS 2009: Sesimbra-Lisbon, Portugal

Aging Monitoring and Analysis

Transient Faults Evaluation and Analysis

System-Level Reliability and Security

Microprocessors and Multiprocessors

Soft Errors and FPGAs

Memories SEU Tolerance and Characterization

Panel: Realistic Low Power Design: Let Errors Occur and Correct them Later or Mitigate Errors via Design Guardbanding and Process Control?

Soft Errors Tolerance

Design for Reliability and Dependability Issues in Massively Parallel Processor Chips

Coding Techniques

High Altitude and Remote SEU Experiments


Fault-Tolerance Techniques

Field Testing and Self-Adaptation

Encoders, Checkers and Fault Secureness

maintained by Schloss Dagstuhl LZI, founded at University of Trier