"Structured Functional Level Test Generation Using Binary Decision Diagrams."

Hongtao P. Chang, William A. Rogers, Jacob A. Abraham (1986)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-10-22

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Hongtao P. Chang, William A. Rogers, Jacob A. Abraham:
Structured Functional Level Test Generation Using Binary Decision Diagrams. ITC 1986: 97-104

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