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ORCIDMehdi Baradaran Tahoori
Mehdi B. Tahoori
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- affiliation: Karlsruhe Institute of Technology, Germany
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2020 – today
- 2022
[j93]Dennis D. Weller
, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori:
Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 695-708 (2022)- [c240]Jonas Krautter, Mahta Mayahinia, Dennis R. E. Gnad, Mehdi B. Tahoori:
Data Leakage through Self-Terminated Write Schemes in Memristive Caches. ASP-DAC 2022: 666-671 - [i10]Giorgos Armeniakos, Georgios Zervakis, Dimitrios Soudris, Mehdi B. Tahoori, Jörg Henkel:
Cross-Layer Approximation For Printed Machine Learning Circuits. CoRR abs/2203.05915 (2022) - [i9]Konstantinos Balaskas, Georgios Zervakis, Kostas Siozios, Mehdi B. Tahoori, Jörg Henkel:
Approximate Decision Trees For Machine Learning Classification on Tiny Printed Circuits. CoRR abs/2203.08011 (2022) - 2021
- [j92]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi B. Tahoori:
An Inside Job: Remote Power Analysis Attacks on FPGAs. IEEE Des. Test 38(3): 58-66 (2021) - [j91]Patrick Girard, Yuanqing Cheng, Arnaud Virazel, Wei Zhao, Rajendra Bishnoi, Mehdi B. Tahoori:
A Survey of Test and Reliability Solutions for Magnetic Random Access Memories. Proc. IEEE 109(2): 149-169 (2021) - [j90]Anteneh Gebregiorgis, Mehdi B. Tahoori:
Approximate Learning and Fault-Tolerant Mapping for Energy-Efficient Neuromorphic Systems. ACM Trans. Design Autom. Electr. Syst. 26(3): 21:1-21:23 (2021) - [j89]Dennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi B. Tahoori:
Voltage-Based Covert Channels Using FPGAs. ACM Trans. Design Autom. Electr. Syst. 26(6): 43:1-43:25 (2021) - [j88]Ahmet Turan Erozan, Simon Bosse, Mehdi B. Tahoori:
Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection. IEEE Trans. Very Large Scale Integr. Syst. 29(8): 1505-1517 (2021) - [c239]Yan Li, Jun Han, Xiaoyang Zeng, Mehdi B. Tahoori:
TRIGON: A Single-phase-clocking Low Power Hardened Flip-Flop with Tolerance to Double-Node-Upset for Harsh Environments Applications. DATE 2021: 88-93 - [c238]Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori:
Printed Stochastic Computing Neural Networks. DATE 2021: 914-919 - [c237]Dennis R. E. Gnad, Vincent Meyers, Nguyen Minh Dang, Falk Schellenberg, Amir Moradi, Mehdi B. Tahoori:
Stealthy Logic Misuse for Power Analysis Attacks in Multi-Tenant FPGAs. DATE 2021: 1012-1015 - [c236]Christopher Münch, Mehdi B. Tahoori:
Testing Resistive Memory based Neuromorphic Architectures using Reference Trimming. DATE 2021: 1592-1595 - [c235]Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori:
Remote and Stealthy Fault Attacks on Virtualized FPGAs. DATE 2021: 1632-1637 - [c234]Soyed Tuhin Ahmed, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori:
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. ETS 2021: 1-6 - [c233]Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. ETS 2021: 1-6 - [c232]Hassan Nassar, Hanna AlZughbi, Dennis R. E. Gnad, Lars Bauer, Mehdi B. Tahoori, Jörg Henkel:
LoopBreaker: Disabling Interconnects to Mitigate Voltage-Based Attacks in Multi-Tenant FPGAs. ICCAD 2021: 1-9 - [c231]Jonas Krautter, Mehdi B. Tahoori:
Neural Networks as a Side-Channel Countermeasure: Challenges and Opportunities. ISVLSI 2021: 272-277 - [c230]Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori:
Analyzing and Mitigating Sensing Failures in Spintronic-based Computing in Memory. ITC 2021: 268-277 - [c229]Sergej Meschkov, Dennis R. E. Gnad, Jonas Krautter, Mehdi B. Tahoori:
Is your secure test infrastructure secure enough? : Attacks based on delay test patterns using transient behavior analysis. ITC 2021: 334-338 - [i8]Mostafa Kishani, Mehdi B. Tahoori, Hossein Asadi:
Dependability Analysis of Data Storage Systems in Presence of Soft Errors. CoRR abs/2112.12520 (2021) - 2020
- [j87]Veronika Ulianova, Farhan Rasheed, Sami Bolat, Galo Torres Sevilla, Yurii Didenko, Xiaowei Feng, Ivan Shorubalko, Dominik Bachmann, Dmytro Tatarchuk, Mehdi B. Tahoori, Jasmin Aghassi-Hagmann, Yaroslav E. Romanyuk:
Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits. IEEE Access 8: 111783-111790 (2020) - [j86]Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori, Falk Schellenberg, Amir Moradi:
Remote Electrical-level Security Threats to Multi-Tenant FPGAs. IEEE Des. Test 37(2): 111-119 (2020) - [j85]Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Crossover-aware Placement and Routing for Inkjet Printed Circuits. ACM J. Emerg. Technol. Comput. Syst. 16(2): 19:1-19:22 (2020) - [j84]Nour Sayed, Rajendra Bishnoi, Mehdi B. Tahoori:
Approximate Spintronic Memories. ACM J. Emerg. Technol. Comput. Syst. 16(4): 43:1-43:22 (2020) - [j83]Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Selective Flip-Flop Optimization for Reliable Digital Circuit Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(7): 1484-1497 (2020) - [j82]Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori:
Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2772-2783 (2020) - [j81]Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, Xiaoyang Zeng:
A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application. IEEE Trans. Circuits Syst. II Express Briefs 67-II(9): 1619-1623 (2020) - [j80]Jonas Krautter, Dennis Gnad, Mehdi Baradaran Tahoori:
CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2020(3): 121-146 (2020) - [j79]Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction. IEEE Trans. Inf. Forensics Secur. 15: 475-486 (2020) - [j78]Arunkumar Vijayan, Mehdi B. Tahoori, Krishnendu Chakrabarty:
Runtime Identification of Hardware Trojans by Feature Analysis on Gate-Level Unstructured Data and Anomaly Detection. ACM Trans. Design Autom. Electr. Syst. 25(4): 33:1-33:23 (2020) - [j77]Samir Ben Dodo, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Secure STT-MRAM Bit-Cell Design Resilient to Differential Power Analysis Attacks. IEEE Trans. Very Large Scale Integr. Syst. 28(1): 263-272 (2020) - [j76]Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation. IEEE Trans. Very Large Scale Integr. Syst. 28(2): 443-455 (2020) - [j75]Ahmet Turan Erozan, Guan Ying Wang, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
A Compact Low-Voltage True Random Number Generator Based on Inkjet Printing Technology. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1485-1495 (2020) - [j74]Ahmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1496-1504 (2020) - [j73]Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori:
A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits. IEEE Trans. Very Large Scale Integr. Syst. 28(11): 2448-2458 (2020) - [c228]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories. ASP-DAC 2020: 393-400 - [c227]Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl:
Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors. ASP-DAC 2020: 446-451 - [c226]Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng:
Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit. DAC 2020: 1-6 - [c225]Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori:
Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling. DATE 2020: 103-108 - [c224]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat:
A Universal Spintronic Technology based on Multifunctional Standardized Stack. DATE 2020: 394-399 - [c223]Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori:
Dynamic Faults based Hardware Trojan Design in STT-MRAM. DATE 2020: 933-938 - [c222]Lukas Zimmermann, Alexander Scholz, Mehdi B. Tahoori, Axel Sikora, Jasmin Aghassi-Hagmann:
Hardware-Intrinsic Security with Printed Electronics for Identification of IoE Devices. ECCTD 2020: 1-4 - [c221]Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS 2020: 1-6 - [c220]Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori:
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. ETS 2020: 1-6 - [c219]Christopher Münch, Mehdi B. Tahoori:
Defect Characterization of Spintronic-based Neuromorphic Circuits. IOLTS 2020: 1-4 - [c218]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor:
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. IRPS 2020: 1-5 - [c217]Nathaniel Bleier, Muhammad Husnain Mubarik, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar:
Printed Microprocessors. ISCA 2020: 213-226 - [c216]Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar:
Printed Machine Learning Classifiers. MICRO 2020: 73-87 - [c215]Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui:
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS 2020: 1-10 - [c214]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Mitigating Read Failures in STT-MRAM. VTS 2020: 1-6
2010 – 2019
- 2019
- [j72]Yuan-Hao Chang, Jingtong Hu, Mehdi Baradaran Tahoori, Ronald F. DeMara:
Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems. IEEE Trans. Computers 68(8): 1111-1113 (2019) - [j71]Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 439-452 (2019) - [j70]Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1928-1941 (2019) - [j69]Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori:
Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019(3): 305-339 (2019) - [j68]Nour Sayed, Longfei Mao, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design. ACM Trans. Design Autom. Electr. Syst. 24(4): 41:1-41:25 (2019) - [j67]Mostafa Kishani, Mehdi Baradaran Tahoori, Hossein Asadi:
Dependability Analysis of Data Storage Systems in Presence of Soft Errors. IEEE Trans. Reliab. 68(1): 201-215 (2019) - [j66]Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori:
Mitigating Electrical-level Attacks towards Secure Multi-Tenant FPGAs in the Cloud. ACM Trans. Reconfigurable Technol. Syst. 12(3): 12:1-12:26 (2019) - [j65]Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1329-1342 (2019) - [j64]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(7): 1697-1710 (2019) - [j63]Lukas Zimmermann, Alexander Scholz, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Axel Sikora:
Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2498-2510 (2019) - [j62]Samir Ben Dodo, Rajendra Bishnoi, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori:
A Spintronics Memory PUF for Resilience Against Cloning Counterfeit. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2511-2522 (2019) - [j61]Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Hardware Trojan Detection Using Changepoint-Based Anomaly Detection Techniques. IEEE Trans. Very Large Scale Integr. Syst. 27(12): 2706-2719 (2019) - [c213]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Reliable in-memory neuromorphic computing using spintronics. ASP-DAC 2019: 230-236 - [c212]Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Predictive Modeling and Design Automation of Inorganic Printed Electronics. DATE 2019: 30-35 - [c211]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability. DATE 2019: 1028-1033 - [c210]Ahmet Turan Erozan, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning. DATE 2019: 1361-1366 - [c209]Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori:
Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation. DATE 2019: 1667-1672 - [c208]Jonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi, Mehdi Baradaran Tahoori:
Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs. ICCAD 2019: 1-8 - [c207]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan:
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS 2019: 80-83 - [c206]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor:
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. IRPS 2019: 1-6 - [c205]Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena Ioana Vatajelu:
IEEE European Test Symposium (ETS). ITC 2019: 1-4 - [c204]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Testing of Neuromorphic Circuits: Structural vs Functional. ITC 2019: 1-10 - [e1]Sheldon X.-D. Tan, Mehdi Baradaran Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr:
Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and Optimization. Springer 2019, ISBN 978-3-030-26171-9 - [i7]Jonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi, Mehdi Baradaran Tahoori:
Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs. IACR Cryptol. ePrint Arch. 2019: 1152 (2019) - [i6]Dennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi Baradaran Tahoori:
Voltage-based Covert Channels in Multi-Tenant FPGAs. IACR Cryptol. ePrint Arch. 2019: 1394 (2019) - [i5]Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Image PUF: A Physical Unclonable Function for Printed Electronics based on Optical Variation of Printed Inks. IACR Cryptol. ePrint Arch. 2019: 1419 (2019) - 2018
- [j60]Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 499-511 (2018) - [j59]Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 1064-1075 (2018) - [j58]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Fazal Hameed, Mehdi Baradaran Tahoori:
VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1396-1407 (2018) - [j57]Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-Flops. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2098-2110 (2018) - [j56]Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori:
FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2018(3): 44-68 (2018) - [j55]Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling. ACM Trans. Design Autom. Electr. Syst. 23(3): 35:1-35:25 (2018) - [j54]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Fine-Grained Energy-Constrained Microprocessor Pipeline Design. IEEE Trans. Very Large Scale Integr. Syst. 26(3): 457-469 (2018) - [j53]Shengcheng Wang, Taeyoung Kim, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori:
Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 26(3): 531-543 (2018) - [j52]Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori:
An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs. IEEE Trans. Very Large Scale Integr. Syst. 26(10): 1817-1830 (2018) - [j51]Ahmet Turan Erozan, Gabriel Cadilha Marques, Mohammad Saber Golanbari, Rajendra Bishnoi, Simone Dehm, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication. IEEE Trans. Very Large Scale Integr. Syst. 26(12): 2935-2946 (2018) - [c203]Nour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM. ASP-DAC 2018: 203-208 - [c202]Mohammad Saber Golanbari, Anteneh Gebregiorgis, Elyas Moradi, Saman Kiamehr, Mehdi Baradaran Tahoori:
Balancing resiliency and energy efficiency of functional units in ultra-low power systems. ASP-DAC 2018: 637-644 - [c201]Gabriel Cadilha Marques, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETs. ASP-DAC 2018: 658-663 - [c200]Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Runtime adjustment of IoT system-on-chips for minimum energy operation. DAC 2018: 145:1-145:6 - [c199]Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Spintronic normally-off heterogeneous system-on-chip design. DATE 2018: 113-118 - [c198]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Parametric failure modeling and yield analysis for STT-MRAM. DATE 2018: 265-268 - [c197]Nour Sayed, Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori:
A cross-layer adaptive approach for performance and power optimization in STT-MRAM. DATE 2018: 791-796 - [c196]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat:
Using multifunctional standardized stack as universal spintronic technology for IoT. DATE 2018: 931-936 - [c195]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
An inside job: Remote power analysis attacks on FPGAs. DATE 2018: 1111-1116 - [c194]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Multi-bit non-volatile spintronic flip-flop. DATE 2018: 1229-1234 - [c193]Dennis R. E. Gnad, Sascha Rapp, Jonas Krautter, Mehdi Baradaran Tahoori:
Checking for Electrical Level Security Threats in Bitstreams for Multi-tenant FPGAs. FPT 2018: 286-289 - [c192]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
Remote inter-chip power analysis side-channel attacks at board-level. ICCAD 2018: 114 - [c191]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis. IOLTS 2018: 265-268 - [c190]Mohammad Saber Golanbari, Saman Kiamehr, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Reliable memory PUF design for low-power applications. ISQED 2018: 207-213 - [c189]Ahmet Turan Erozan, Mohammad Saber Golanbari, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Design and evaluation of physical unclonable function for inorganic printed electronics. ISQED 2018: 419-424 - [c188]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian:
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC 2018: 1-10 - [c187]Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC 2018: 1-10 - [c186]Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Optimizing Datapaths for Near Threshold Computing. SMACD 2018: 69-72 - [i4]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
An Inside Job: Remote Power Analysis Attacks on FPGAs. IACR Cryptol. ePrint Arch. 2018: 12 (2018) - [i3]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level. IACR Cryptol. ePrint Arch. 2018: 881 (2018) - 2017
- [j50]Navid Khoshavi, Rizwan A. Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori:
Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods. Integr. 59: 10-22 (2017) - [j49]Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori:
Logic synthesis and testing techniques for switching nano-crossbar arrays. Microprocess. Microsystems 54: 14-25 (2017) - [j48]Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori:
Bias Temperature Instability Mitigation via Adaptive Cache Size Management. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1012-1022 (2017) - [j47]Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori:
Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1421-1432 (2017) - [j46]