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ORCIDMehdi Baradaran Tahoori
Mehdi B. Tahoori
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- affiliation: Karlsruhe Institute of Technology, Germany
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2020 – today
- 2020
[j85]Veronika Ulianova
, Farhan Rasheed, Sami Bolat, Galo Torres Sevilla, Yurii Didenko, Xiaowei Feng, Ivan Shorubalko, Dominik Bachmann, Dmytro Tatarchuk, Mehdi B. Tahoori, Jasmin Aghassi-Hagmann, Yaroslav E. Romanyuk:
Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits. IEEE Access 8: 111783-111790 (2020)- [j84]Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori, Falk Schellenberg, Amir Moradi:
Remote Electrical-level Security Threats to Multi-Tenant FPGAs. IEEE Des. Test 37(2): 111-119 (2020) - [j83]Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Crossover-aware Placement and Routing for Inkjet Printed Circuits. ACM J. Emerg. Technol. Comput. Syst. 16(2): 19:1-19:22 (2020) - [j82]Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Selective Flip-Flop Optimization for Reliable Digital Circuit Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(7): 1484-1497 (2020) - [j81]Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori:
Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2772-2783 (2020) - [j80]Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, Xiaoyang Zeng:
A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application. IEEE Trans. Circuits Syst. II Express Briefs 67-II(9): 1619-1623 (2020) - [j79]Jonas Krautter, Dennis Gnad, Mehdi Baradaran Tahoori:
CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical Design. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2020(3): 121-146 (2020) - [j78]Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist Extraction. IEEE Trans. Inf. Forensics Secur. 15: 475-486 (2020) - [j77]Arunkumar Vijayan, Mehdi B. Tahoori, Krishnendu Chakrabarty:
Runtime Identification of Hardware Trojans by Feature Analysis on Gate-Level Unstructured Data and Anomaly Detection. ACM Trans. Design Autom. Electr. Syst. 25(4): 33:1-33:23 (2020) - [j76]Samir Ben Dodo, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Secure STT-MRAM Bit-Cell Design Resilient to Differential Power Analysis Attacks. IEEE Trans. Very Large Scale Integr. Syst. 28(1): 263-272 (2020) - [j75]Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation. IEEE Trans. Very Large Scale Integr. Syst. 28(2): 443-455 (2020) - [j74]Ahmet Turan Erozan, Guan Ying Wang, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
A Compact Low-Voltage True Random Number Generator Based on Inkjet Printing Technology. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1485-1495 (2020) - [j73]Ahmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit. IEEE Trans. Very Large Scale Integr. Syst. 28(6): 1496-1504 (2020) - [c227]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories. ASP-DAC 2020: 393-400 - [c226]Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl:
Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors. ASP-DAC 2020: 446-451 - [c225]Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, Xiaoyang Zeng:
Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit. DAC 2020: 1-6 - [c224]Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori:
Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling. DATE 2020: 103-108 - [c223]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, P. Benoit, Gregory di Pendina, Guillaume Prenat:
A Universal Spintronic Technology based on Multifunctional Standardized Stack. DATE 2020: 394-399 - [c222]Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori:
Dynamic Faults based Hardware Trojan Design in STT-MRAM. DATE 2020: 933-938 - [c221]Lukas Zimmermann, Alexander Scholz, Mehdi B. Tahoori, Axel Sikora, Jasmin Aghassi-Hagmann:
Hardware-Intrinsic Security with Printed Electronics for Identification of IoE Devices. ECCTD 2020: 1-4 - [c220]Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS 2020: 1-6 - [c219]Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori:
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. ETS 2020: 1-6 - [c218]Christopher Münch, Mehdi B. Tahoori:
Defect Characterization of Spintronic-based Neuromorphic Circuits. IOLTS 2020: 1-4 - [c217]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor:
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. IRPS 2020: 1-5 - [c216]Nathaniel Bleier, Muhammad Husnain Mubarik, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar:
Printed Microprocessors. ISCA 2020: 213-226 - [c215]Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui:
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS 2020: 1-10 - [c214]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Mitigating Read Failures in STT-MRAM. VTS 2020: 1-6
2010 – 2019
- 2019
- [j72]Yuan-Hao Chang, Jingtong Hu, Mehdi Baradaran Tahoori, Ronald F. DeMara:
Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and Systems. IEEE Trans. Computers 68(8): 1111-1113 (2019) - [j71]Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 439-452 (2019) - [j70]Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1928-1941 (2019) - [j69]Dennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori:
Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT Devices. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019(3): 305-339 (2019) - [j68]Nour Sayed, Longfei Mao, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache Design. ACM Trans. Design Autom. Electr. Syst. 24(4): 41:1-41:25 (2019) - [j67]Mostafa Kishani, Mehdi Baradaran Tahoori, Hossein Asadi:
Dependability Analysis of Data Storage Systems in Presence of Soft Errors. IEEE Trans. Reliab. 68(1): 201-215 (2019) - [j66]Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori:
Mitigating Electrical-level Attacks towards Secure Multi-Tenant FPGAs in the Cloud. ACM Trans. Reconfigurable Technol. Syst. 12(3): 12:1-12:26 (2019) - [j65]Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1329-1342 (2019) - [j64]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(7): 1697-1710 (2019) - [j63]Lukas Zimmermann, Alexander Scholz, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Axel Sikora:
Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable Function. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2498-2510 (2019) - [j62]Samir Ben Dodo, Rajendra Bishnoi, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori:
A Spintronics Memory PUF for Resilience Against Cloning Counterfeit. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2511-2522 (2019) - [j61]Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Hardware Trojan Detection Using Changepoint-Based Anomaly Detection Techniques. IEEE Trans. Very Large Scale Integr. Syst. 27(12): 2706-2719 (2019) - [c213]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Reliable in-memory neuromorphic computing using spintronics. ASP-DAC 2019: 230-236 - [c212]Farhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Predictive Modeling and Design Automation of Inorganic Printed Electronics. DATE 2019: 30-35 - [c211]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability. DATE 2019: 1028-1033 - [c210]Ahmet Turan Erozan, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning. DATE 2019: 1361-1366 - [c209]Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori:
Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation. DATE 2019: 1667-1672 - [c208]Jonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi, Mehdi Baradaran Tahoori:
Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs. ICCAD 2019: 1-8 - [c207]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, G. Tshagharyan:
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS 2019: 80-83 - [c206]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor:
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. IRPS 2019: 1-6 - [c205]Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena Ioana Vatajelu:
IEEE European Test Symposium (ETS). ITC 2019: 1-4 - [c204]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Testing of Neuromorphic Circuits: Structural vs Functional. ITC 2019: 1-10 - [e1]Sheldon X.-D. Tan, Mehdi Baradaran Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr:
Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and Optimization. Springer 2019, ISBN 978-3-030-26171-9 - [i7]Jonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi, Mehdi Baradaran Tahoori:
Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAs. IACR Cryptol. ePrint Arch. 2019: 1152 (2019) - [i6]Dennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi Baradaran Tahoori:
Voltage-based Covert Channels in Multi-Tenant FPGAs. IACR Cryptol. ePrint Arch. 2019: 1394 (2019) - [i5]Ahmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Image PUF: A Physical Unclonable Function for Printed Electronics based on Optical Variation of Printed Inks. IACR Cryptol. ePrint Arch. 2019: 1419 (2019) - 2018
- [j60]Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 499-511 (2018) - [j59]Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 1064-1075 (2018) - [j58]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Fazal Hameed, Mehdi Baradaran Tahoori:
VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1396-1407 (2018) - [j57]Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-Flops. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2098-2110 (2018) - [j56]Jonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori:
FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AES. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2018(3): 44-68 (2018) - [j55]Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test Scheduling. ACM Trans. Design Autom. Electr. Syst. 23(3): 35:1-35:25 (2018) - [j54]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Fine-Grained Energy-Constrained Microprocessor Pipeline Design. IEEE Trans. Very Large Scale Integr. Syst. 26(3): 457-469 (2018) - [j53]Shengcheng Wang, Taeyoung Kim, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori:
Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 26(3): 531-543 (2018) - [j52]Dennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori:
An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAs. IEEE Trans. Very Large Scale Integr. Syst. 26(10): 1817-1830 (2018) - [j51]Ahmet Turan Erozan, Gabriel Cadilha Marques, Mohammad Saber Golanbari, Rajendra Bishnoi, Simone Dehm, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication. IEEE Trans. Very Large Scale Integr. Syst. 26(12): 2935-2946 (2018) - [c203]Nour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM. ASP-DAC 2018: 203-208 - [c202]Mohammad Saber Golanbari, Anteneh Gebregiorgis, Elyas Moradi, Saman Kiamehr, Mehdi Baradaran Tahoori:
Balancing resiliency and energy efficiency of functional units in ultra-low power systems. ASP-DAC 2018: 637-644 - [c201]Gabriel Cadilha Marques, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETs. ASP-DAC 2018: 658-663 - [c200]Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Runtime adjustment of IoT system-on-chips for minimum energy operation. DAC 2018: 145:1-145:6 - [c199]Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Spintronic normally-off heterogeneous system-on-chip design. DATE 2018: 113-118 - [c198]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Parametric failure modeling and yield analysis for STT-MRAM. DATE 2018: 265-268 - [c197]Nour Sayed, Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori:
A cross-layer adaptive approach for performance and power optimization in STT-MRAM. DATE 2018: 791-796 - [c196]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat:
Using multifunctional standardized stack as universal spintronic technology for IoT. DATE 2018: 931-936 - [c195]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
An inside job: Remote power analysis attacks on FPGAs. DATE 2018: 1111-1116 - [c194]Christopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Multi-bit non-volatile spintronic flip-flop. DATE 2018: 1229-1234 - [c193]Dennis R. E. Gnad, Sascha Rapp, Jonas Krautter, Mehdi Baradaran Tahoori:
Checking for Electrical Level Security Threats in Bitstreams for Multi-tenant FPGAs. FPT 2018: 286-289 - [c192]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
Remote inter-chip power analysis side-channel attacks at board-level. ICCAD 2018: 114 - [c191]Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis. IOLTS 2018: 265-268 - [c190]Mohammad Saber Golanbari, Saman Kiamehr, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Reliable memory PUF design for low-power applications. ISQED 2018: 207-213 - [c189]Ahmet Turan Erozan, Mohammad Saber Golanbari, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori:
Design and evaluation of physical unclonable function for inorganic printed electronics. ISQED 2018: 419-424 - [c188]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, G. Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian:
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC 2018: 1-10 - [c187]G. Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. ITC 2018: 1-10 - [c186]Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Optimizing Datapaths for Near Threshold Computing. SMACD 2018: 69-72 - [i4]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
An Inside Job: Remote Power Analysis Attacks on FPGAs. IACR Cryptol. ePrint Arch. 2018: 12 (2018) - [i3]Falk Schellenberg, Dennis R. E. Gnad, Amir Moradi, Mehdi Baradaran Tahoori:
Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-Level. IACR Cryptol. ePrint Arch. 2018: 881 (2018) - 2017
- [j50]Navid Khoshavi, Rizwan A. Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori:
Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods. Integr. 59: 10-22 (2017) - [j49]Dan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori:
Logic synthesis and testing techniques for switching nano-crossbar arrays. Microprocess. Microsystems 54: 14-25 (2017) - [j48]Nezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori:
Bias Temperature Instability Mitigation via Adaptive Cache Size Management. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1012-1022 (2017) - [j47]Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori:
Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1421-1432 (2017) - [j46]Saman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing. IEEE Trans. Very Large Scale Integr. Syst. 25(7): 2017-2026 (2017) - [j45]Shengcheng Wang, Mehdi Baradaran Tahoori:
Electromigration-Aware Local-Via Allocation in Power/Ground TSVs of 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 25(10): 2881-2892 (2017) - [c185]Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Workload-aware static aging monitoring of timing-critical flip-flops. ASP-DAC 2017: 176-181 - [c184]Kentaro Iwata, Amir Masoud Gharehbaghi, Mehdi Baradaran Tahoori, Masahiro Fujita:
Post Silicon Debugging of Electrical Bugs Using Trace Buffers. ATS 2017: 189-194 - [c183]Anteneh Gebregiorgis, Saman Kiamehr, Mehdi Baradaran Tahoori:
Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing. DAC 2017: 77:1-77:6 - [c182]Shengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori:
Recovery-aware proactive TSV repair for electromigration in 3D ICs. DATE 2017: 220-225 - [c181]Mustafa Altun, Valentina Ciriani, Mehdi Baradaran Tahoori:
Computing with nano-crossbar arrays: Logic synthesis and fault tolerance. DATE 2017: 278-281 - [c180]Nour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Opportunistic write for fast and reliable STT-MRAM. DATE 2017: 554-559 - [c179]Saman Kiamehr, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Leveraging aging effect to improve SRAM-based true random number generators. DATE 2017: 882-885 - [c178]Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori:
VAET-STT: A variation aware estimator tool for STT-MRAM based memories. DATE 2017: 1456-1461 - [c177]Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori:
Aging-aware coding scheme for memory arrays. ETS 2017: 1-6 - [c176]Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Exploiting STT-MRAM for approximate computing. ETS 2017: 1-6 - [c175]Dennis Weller, Fabian Oboril, Dimitar Lukarski, Jürgen Becker, Mehdi Baradaran Tahoori:
Energy Efficient Scientific Computing on FPGAs using OpenCL. FPGA 2017: 247-256 - [c174]Dennis R. E. Gnad, Fabian Oboril, Mehdi Baradaran Tahoori:
Voltage drop-based fault attacks on FPGAs using valid bitstreams. FPL 2017: 1-7 - [c173]Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori:
Leveraging recovery effect to reduce electromigration degradation in power/ground TSV. ICCAD 2017: 811-818 - [c172]Mohammad Saber Golanbari, Mehdi Baradaran Tahoori:
Design flows for resilient energy-efficient systems. IOLTS 2017: 233-236 - [c171]Mohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori:
Post-fabrication calibration of Near-Threshold circuits for energy efficiency. ISQED 2017: 385-390 - [c170]Sparsh Mittal, Rajendra Bishnoi, Fabian Oboril, Haonan Wang, Mehdi Baradaran Tahoori, Adwait Jog, Jeffrey S. Vetter:
Architecting SOT-RAM Based GPU Register File. ISVLSI 2017: 38-44 - [c169]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat:
GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack. ISVLSI 2017: 344-349 - [c168]Rana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Run-time hardware trojan detection using performance counters. ITC 2017: 1-10 - [c167]Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cache. VTS 2017: 1-6 - 2016
- [j44]Mojtaba Ebrahimi, Hossein Asadi, Rajendra Bishnoi, Mehdi Baradaran Tahoori:
Layout-Based Modeling and Mitigation of Multiple Event Transients. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(3): 367-379 (2016) - [j43]Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
On-Chip Droop-Induced Circuit Delay Prediction Based on Support-Vector Machines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(4): 665-678 (2016) - [j42]Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori:
Built-In Self-Heating Thermal Testing of FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(9): 1546-1556 (2016) - [j41]Guillaume Prenat, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Fabian Oboril, Rajendra Bishnoi, Mojtaba Ebrahimi, Nathalie Lamard, Olivier Boulle, Kevin Garello, Juergen Langer, Berthold Ocker, Marie-Claire Cyrille, Pietro Gambardella, Mehdi Baradaran Tahoori, Gilles Gaudin:
Ultra-Fast and High-Reliability SOT-MRAM: From Cache Replacement to Normally-Off Computing. IEEE Trans. Multi Scale Comput. Syst. 2(1): 49-60 (2016) - [j40]Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Reliability-Aware Resource Allocation and Binding in High-Level Synthesis. ACM Trans. Design Autom. Electr. Syst. 21(2): 30:1-30:27 (2016) - [j39]Mojtaba Ebrahimi, Parthasarathy Murali B. Rao, Razi Seyyedi, Mehdi Baradaran Tahoori:
Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 932-943 (2016) - [j38]Rajendra Bishnoi, Fabian Oboril, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori:
Self-Timed Read and Write Operations in STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1783-1793 (2016) - [c166]Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori:
Non-Volatile Non-Shadow flip-flop using Spin Orbit Torque for efficient normally-off computing. ASP-DAC 2016: 769-774 - [c165]Mehdi Baradaran Tahoori, Krishnendu Chakrabarty:
Test and Reliability Issues in 2.5D and 3D Integration. ATS 2016: 73 - [c164]Shengcheng Wang, Ran Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Multicast Test Architecture and Test Scheduling for Interposer-Based 2.5D ICs. ATS 2016: 86-91 - [c163]