DFT 2007: Rome, Italy

Session 1 - Reliable NoCs and SoCs

Session 2 - Single Event Effects

Session 3 - Defect and Fault Tolerance

Session 4 - Fault Injection and Reliability Analysis

Interactive Poster Session

Session 5 - Testing and Design for Testability

Session 6 - Soft Errors

Session 7 - Defect and Fault Tolerance

Session 8 - Dependable Solutions for Memories and Storage

Session 9 - Reliable Design Techniques

Session 10 - Emerging Technologies - 1

Session 11 - Testing

Session 12 - Emerging Technologies - 2

Session 13 - Reliable Applications

a service of Schloss Dagstuhl - Leibniz Center for Informatics