DFT 2004: Cannes, France

Yield and Defects I

Yield and Defects II


Defect and Fault Tolerance

Memory Test


Error Correcting Codes

Interconnect Faults

RF and High Speed Circuits

Analog Testing

Interactive Session

Error Detection and Correction

System-on-Chip Test

Circuit and System Reliability and Dependability

Novel Test Approaches

FPGA and Reconfigurable Circuit

maintained by Schloss Dagstuhl LZI, founded at University of Trier