DFT 2004: Cannes, France

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Yield and Defects I

Yield and Defects II


Defect and Fault Tolerance

Memory Test


Error Correcting Codes

Interconnect Faults

RF and High Speed Circuits

Analog Testing

Interactive Session

Error Detection and Correction

System-on-Chip Test

Circuit and System Reliability and Dependability

Novel Test Approaches

FPGA and Reconfigurable Circuit

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