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"Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and ..."

Sheldon X.-D. Tan et al. (2019)

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DOI: 10.1007/978-3-030-26172-6

access: closed

type: Editorship

metadata version: 2021-02-19

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Sheldon X.-D. Tan, Mehdi Baradaran Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr:
Long-Term Reliability of Nanometer VLSI Systems, Modeling, Analysis and Optimization. Springer 2019, ISBN 978-3-030-26171-9

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