"Testing for Electromigration in Sub-5-nm FinFET Memories."

Mahta Mayahinia et al. (2024)

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DOI: 10.1109/MDAT.2024.3411527

access: closed

type: Journal Article

metadata version: 2024-11-30

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Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian:
Testing for Electromigration in Sub-5-nm FinFET Memories. IEEE Des. Test 41(6): 54-61 (2024)

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