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"An Efficient Test Strategy for Detection of Electromigration Impact in ..."

Mahta Mayahinia et al. (2022)

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DOI: 10.1109/ITC50671.2022.00091

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-06

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Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan:
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ITC 2022: 650-655

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