"Defect Characterization and Test Generation for Spintronic-based ..."

Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori (2020)

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DOI: 10.1109/ETS48528.2020.9131582

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-15

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Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori:
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. ETS 2020: 1-6

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