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ORCIDSaid Hamdioui
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2020 – today
- 2024
[j78]Sumit Diware
, Koteswararao Chilakala, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Reliable and Energy-Efficient Diabetic Retinopathy Screening Using Memristor-Based Neural Networks. IEEE Access 12: 47469-47482 (2024)- [j77]Abdullah Aljuffri, Ruoyu Huang, Laura Muntenaar, Georgi Gaydadjiev, Kezheng Ma, Said Hamdioui, Mottaqiallah Taouil:
The Security Evaluation of an Efficient Lightweight AES Accelerator. Cryptogr. 8(2): 24 (2024) - [j76]Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Survey on Architectural Attacks: A Unified Classification and Attack Model. ACM Comput. Surv. 56(2): 42:1-42:32 (2024) - [j75]Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls:
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. J. Electron. Test. 40(2): 245-257 (2024) - [j74]Abdulqader Nael Mahmoud, Florin Ciubotaru, Frederic Vanderveken, Christoph Adelmann, Sorin Cotofana, Said Hamdioui:
Two Cascaded Spin Wave Majority Gates Operation Under Continuous and Pulse Modes. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 1919-1923 (2024) - [c273]Sumit Diware, Mohammad Amin Yaldagard, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Dynamic Detection and Mitigation of Read-disturb for Accurate Memristor-based Neural Networks. AICAS 2024: 393-397 - [c272]Muhammad Ali Siddiqi, David Vrijenhoek, Lennart P. L. Landsmeer, Job van der Kleij, Anteneh Gebregiorgis, Vincenzo Romano, Rajendra Bishnoi, Said Hamdioui, Christos Strydis:
A Lightweight Architecture for Real-Time Neuronal-Spike Classification. CF 2024 - [c271]Taha Shahroodi, Raphael Cardoso, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui:
High-Performance Data Mapping for BNNs on PCM-Based Integrated Photonics. DATE 2024: 1-6 - [c270]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE 2024: 1-6 - [c269]Erbing Hua, Heba Abunahla, Georgi Gaydadjiev, Said Hamdioui, Ryoichi Ishihara:
Multi-level forming-free HfO2-based ReRAM for energy-efficient computing. DRC 2024: 1-2 - [c268]Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil:
Counteracting Rowhammer by Data Alternation. ETS 2024: 1-6 - [c267]Fouwad Jamil Mir, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil:
Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. ETS 2024: 1-4 - [c266]Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Online Detection of Unique Faults in RRAMs. ETS 2024: 1-2 - [c265]Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS 2024: 1-6 - [c264]Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe:
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS 2024: 1-5 - [c263]Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani:
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. LATS 2024: 1-6 - [i18]Arne Van Zegbroeck, Pantazis Anagnostou, Said Hamdioui, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana:
Spin Wave Threshold Gate. CoRR abs/2401.12136 (2024) - [i17]Taha Shahroodi, Raphael Cardoso, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui:
High-Performance Data Mapping for BNNs on PCM-based Integrated Photonics. CoRR abs/2401.17724 (2024) - [i16]Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil:
Memristor-Based Lightweight Encryption. CoRR abs/2404.00125 (2024) - [i15]Alexandra F. Dobrita, Amirreza Yousefzadeh, Simon Thorpe, Kanishkan Vadivel, Paul Detterer, Guangzhi Tang, Gert-Jan van Schaik, Mario Konijnenburg, Anteneh Gebregiorgis, Said Hamdioui, Manolis Sifalakis:
EON-1: A Brain-Inspired Processor for Near-Sensor Extreme Edge Online Feature Extraction. CoRR abs/2406.17285 (2024) - 2023
- [j73]Mahdi Zahedi, Taha Shahroodi, Stephan Wong, Said Hamdioui:
Efficient Signed Arithmetic Multiplication on Memristor-Based Crossbar. IEEE Access 11: 33964-33978 (2023) - [j72]Josie E. Rodriguez Condia, Felipe Augusto da Silva, Ahmet Çagri Bagbaga, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda:
Using STLs for Effective In-Field Test of GPUs. IEEE Des. Test 40(2): 109-117 (2023) - [j71]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil:
A Survey on Machine Learning in Hardware Security. ACM J. Emerg. Technol. Comput. Syst. 19(2): 18:1-18:37 (2023) - [j70]Sumit Diware, Sudeshna Dash, Anteneh Gebregiorgis, Rajiv V. Joshi, Christos Strydis, Said Hamdioui, Rajendra Bishnoi:
Severity-Based Hierarchical ECG Classification Using Neural Networks. IEEE Trans. Biomed. Circuits Syst. 17(1): 77-91 (2023) - [j69]Sumit Diware, Abhairaj Singh, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks. IEEE Trans. Emerg. Top. Comput. Intell. 7(1): 164-177 (2023) - [c262]Sumit Diware, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Mapping-aware Biased Training for Accurate Memristor-based Neural Networks. AICAS 2023: 1-5 - [c261]Abhairaj Singh, Rajendra Bishnoi, Ali Kaichouhi, Sumit Diware, Rajiv V. Joshi, Said Hamdioui:
A 115.1 TOPS/W, 12.1 TOPS/mm2 Computation-in-Memory using Ring-Oscillator based ADC for Edge AI. AICAS 2023: 1-5 - [c260]Mohammad Amin Yaldagard, Sumit Diware, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture. AICAS 2023: 1-5 - [c259]Taha Shahroodi, Michael Miao, Mahdi Zahedi, Stephan Wong, Said Hamdioui:
SieveMem: A Computation-in-Memory Architecture for Fast and Accurate Pre-Alignment. ASAP 2023: 156-164 - [c258]Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Device Aware Diagnosis for Unique Defects in STT-MRAMs. ATS 2023: 1-6 - [c257]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. ATS 2023: 1-6 - [c256]Manil Dev Gomony, Floran de Putter, Anteneh Gebregiorgis, Gianna Paulin, Linyan Mei, Vikram Jain, Said Hamdioui, Victor Sanchez, Tobias Grosser, Marc Geilen, Marian Verhelst, Friedemann Zenke, Frank K. Gürkaynak, Barry de Bruin, Sander Stuijk, Simon Davidson, Sayandip De, Mounir Ghogho, Alexandra Jimborean, Sherif Eissa, Luca Benini, Dimitrios Soudris, Rajendra Bishnoi, Sam Ainsworth, Federico Corradi, Ouassim Karrakchou, Tim Güneysu, Henk Corporaal:
PetaOps/W edge-AI $\mu$ Processors: Myth or reality? DATE 2023: 1-6 - [c255]Taha Shahroodi, Raphael Cardoso, Mahdi Zahedi, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui:
Lightspeed Binary Neural Networks using Optical Phase-Change Materials. DATE 2023: 1-2 - [c254]Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6 - [c253]Mahdi Zahedi, Geert Custers, Taha Shahroodi, Georgi Gaydadjiev, Stephan Wong, Said Hamdioui:
SparseMEM: Energy-efficient Design for In-memory Sparse-based Graph Processing. DATE 2023: 1-6 - [c252]Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. DSD 2023: 87-94 - [c251]Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebreziorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil:
Memristor-Based Lightweight Encryption. DSD 2023: 634-641 - [c250]Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui:
Online Fault Detection and Diagnosis in RRAM. ETS 2023: 1-6 - [c249]Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui:
Dependability of Future Edge-AI Processors: Pandora's Box. ETS 2023: 1-6 - [c248]Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui:
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS 2023: 1-6 - [c247]Rajendra Bishnoi, Sumit Diware, Anteneh Gebregiorgis, Simon Thomann, Sara Mannaa, Bastien Deveautour, Cédric Marchand, Alberto Bosio, Damien Deleruyelle, Ian O'Connor, Hussam Amrouch, Said Hamdioui:
Energy-efficient Computation-In-Memory Architecture using Emerging Technologies. ICM 2023: 325-334 - [c246]Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC 2023: 236-245 - [c245]Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC 2023: 246-255 - [c244]Taha Shahroodi, Gagandeep Singh, Mahdi Zahedi, Haiyu Mao, Joël Lindegger, Can Firtina, Stephan Wong, Onur Mutlu, Said Hamdioui:
Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors. MICRO 2023: 1437-1452 - [c243]Arne Van Zegbroeck, Pantazis Anagnostou, Said Hamdioui, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana:
Spin Wave Threshold Logic Gates. NANOARCH 2023: 31:1-31:6 - [c242]Taha Shahroodi, Michael Miao, Mahdi Zahedi, Stephan Wong, Said Hamdioui:
RattlesnakeJake: A Fast and Accurate Pre-alignment Filter Suitable for Computation-in-Memory. SAMOS 2023: 209-221 - [c241]Christopher Bengel, Anteneh Gebregiorgis, Stephan Menzel, Rainer Waser, Georgi Gaydadjiev, Said Hamdioui:
Devices and Architectures for Efficient Computing In-Memory (CIM) Design. SAMOS 2023: 437-450 - [c240]Taha Shahroodi, Stephan Wong, Said Hamdioui:
A Case for Genome Analysis Where Genomes Reside. SAMOS 2023: 453-458 - [c239]Ruoyu Huang, Abdullah Aljuffri, Said Hamdioui, Kezheng Ma, Mottaqiallah Taouil:
Securing an Efficient Lightweight AES Accelerator. TrustCom 2023: 841-848 - [c238]Hassen Aziza, Cristian Zambelli, Said Hamdioui, Sumit Diware, Rajendra Bishnoi, Anteneh Gebregiorgis:
On the Reliability of RRAM-Based Neural Networks. VLSI-SoC 2023: 1-8 - [c237]Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. VLSI-SoC 2023: 1-6 - [i14]Taha Shahroodi, Gagandeep Singh, Mahdi Zahedi, Haiyu Mao, Joël Lindegger, Can Firtina, Stephan Wong, Onur Mutlu, Said Hamdioui:
Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors. CoRR abs/2310.04366 (2023) - [i13]Taha Shahroodi, Michael Miao, Joël Lindegger, Stephan Wong, Onur Mutlu, Said Hamdioui:
An In-Memory Architecture for High-Performance Long-Read Pre-Alignment Filtering. CoRR abs/2310.15634 (2023) - [i12]Muhammad Ali Siddiqi, David Vrijenhoek, Lennart P. L. Landsmeer, Job van der Kleij, Anteneh Gebregiorgis, Vincenzo Romano, Rajendra Bishnoi, Said Hamdioui, Christos Strydis:
A Lightweight Architecture for Real-Time Neuronal-Spike Classification. CoRR abs/2311.04808 (2023) - 2022
- [j68]Muhammad Ali Siddiqi, Georg Hahn, Said Hamdioui, Wouter A. Serdijn, Christos Strydis:
Improving the Security of the IEEE 802.15.6 Standard for Medical BANs. IEEE Access 10: 62953-62975 (2022) - [j67]Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama:
Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning. IEEE Access 10: 70187-70203 (2022) - [j66]Taha Shahroodi, Mahdi Zahedi, Can Firtina, Mohammed Alser, Stephan Wong, Onur Mutlu, Said Hamdioui:
Demeter: A Fast and Energy-Efficient Food Profiler Using Hyperdimensional Computing in Memory. IEEE Access 10: 82493-82510 (2022) - [j65]Said Hamdioui, Elena I. Vatajelu, Alberto Bosio:
Guest Editorial: Computation-In-Memory (CIM): from Device to Applications. ACM J. Emerg. Technol. Comput. Syst. 18(2): 31:1-31:3 (2022) - [j64]Mahta Mayahinia, Abhairaj Singh, Christopher Bengel, Stefan Wiefels, Muath Abu Lebdeh, Stephan Menzel, Dirk J. Wouters, Anteneh Gebregiorgis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui:
A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs. ACM J. Emerg. Technol. Comput. Syst. 18(2): 32:1-32:25 (2022) - [j63]Mahdi Zahedi, Muath Abu Lebdeh, Christopher Bengel, Dirk J. Wouters, Stephan Menzel, Manuel Le Gallo, Abu Sebastian, Stephan Wong, Said Hamdioui:
MNEMOSENE: Tile Architecture and Simulator for Memristor-based Computation-in-memory. ACM J. Emerg. Technol. Comput. Syst. 18(3): 44:1-44:24 (2022) - [j62]Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui:
Defects, Fault Modeling, and Test Development Framework for RRAMs. ACM J. Emerg. Technol. Comput. Syst. 18(3): 52:1-52:26 (2022) - [j61]Anteneh Gebregiorgis, Hoang Anh Du Nguyen, Jintao Yu, Rajendra Bishnoi, Mottaqiallah Taouil, Francky Catthoor, Said Hamdioui:
A Survey on Memory-centric Computer Architectures. ACM J. Emerg. Technol. Comput. Syst. 18(4): 79:1-79:50 (2022) - [j60]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Marcelo Brandalero, Said Hamdioui, Mottaqiallah Taouil:
Instruction flow-based detectors against fault injection attacks. Microprocess. Microsystems 94: 104638 (2022) - [j59]Christopher Bengel, Johannes Mohr, Stefan Wiefels, Abhairaj Singh, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Rainer Waser, Dirk J. Wouters, Stephan Menzel:
Reliability aspects of binary vector-matrix-multiplications using ReRAM devices. Neuromorph. Comput. Eng. 2(3): 34001 (2022) - [j58]Amirreza Yousefzadeh, Jan Stuijt, Martijn Hijdra, Hsiao-Hsuan Liu, Anteneh Gebregiorgis, Abhairaj Singh, Said Hamdioui, Francky Catthoor:
Energy-efficient In-Memory Address Calculation. ACM Trans. Archit. Code Optim. 19(4): 52:1-52:16 (2022) - [j57]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Trans. Computers 71(9): 2219-2233 (2022) - [j56]Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui:
APmap: An Open-Source Compiler for Automata Processors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(1): 196-200 (2022) - [j55]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4991-5004 (2022) - [j54]Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Said Hamdioui, Sorin Cotofana:
Non-Binary Spin Wave Based Circuit Design. IEEE Trans. Circuits Syst. I Regul. Pap. 69(10): 3888-3900 (2022) - [j53]Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Said Hamdioui, Sorin Cotofana:
Spin Wave Based Approximate Computing. IEEE Trans. Emerg. Top. Comput. 10(4): 1932-1940 (2022) - [c236]Abhairaj Singh, Mahdi Zahedi, Taha Shahroodi, Mohit Gupta, Anteneh Gebregiorgis, Manu Komalan, Rajiv V. Joshi, Francky Catthoor, Rajendra Bishnoi, Said Hamdioui:
CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out. AICAS 2022: 451-454 - [c235]Troya Çagil Köylü, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil:
Using Hopfield Networks to Correct Instruction Faults. ATS 2022: 102-107 - [c234]Shayesteh Masoumian, Georgios N. Selimis, Rui Wang, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. DATE 2022: 1189-1192 - [c233]Abhairaj Singh, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui:
Referencing-in-Array Scheme for RRAM-based CIM Architecture. DATE 2022: 1413-1418 - [c232]Troya Çagil Köylü, Luíza C. Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil:
Exploiting PUF Variation to Detect Fault Injection Attacks. DDECS 2022: 74-79 - [c231]Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori:
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. ETS 2022: 1-6 - [c230]Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui:
RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). ETS 2022: 1-2 - [c229]Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil:
Smart Redundancy Schemes for ANNs Against Fault Attacks. ETS 2022: 1-2 - [c228]Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui:
Hierarchical Memory Diagnosis. ETS 2022: 1-2 - [c227]Abdulqader Nael Mahmoud, Nicoleta Cucu Laurenciu, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui:
Would Magnonic Circuits Outperform CMOS Counterparts? ACM Great Lakes Symposium on VLSI 2022: 309-313 - [c226]Taha Shahroodi, Mahdi Zahedi, Abhairaj Singh, Stephan Wong, Said Hamdioui:
KrakenOnMem: a memristor-augmented HW/SW framework for taxonomic profiling. ICS 2022: 29:1-29:14 - [c225]Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu:
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS 2022: 1-10 - [c224]Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui:
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. ITC 2022: 400-409 - [c223]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Structured Test Development Approach for Computation-in-Memory Architectures. ITC-Asia 2022: 61-66 - [c222]Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls:
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS 2022: 1-6 - [c221]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. LATS 2022: 1-6 - [c220]Asmae El Arrassi, Anteneh Gebregiorgis, Anass El Haddadi, Said Hamdioui:
Energy-Efficient SNN Implementation Using RRAM-Based Computation In-Memory (CIM). VLSI-SoC 2022: 1-6 - [c219]Anteneh Gebregiorgis, Abhairaj Singh, Sumit Diware, Rajendra Bishnoi, Said Hamdioui:
Dealing with Non-Idealities in Memristor Based Computation-In-Memory Designs. VLSI-SoC 2022: 1-6 - [c218]Mahdi Zahedi, Taha Shahroodi, Geert Custers, Abhairaj Singh, Stephan Wong, Said Hamdioui:
System Design for Computation-in-Memory: From Primitive to Complex Functions. VLSI-SoC 2022: 1-6 - [c217]Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui:
Special Session: STT-MRAMs: Technology, Design and Test. VTS 2022: 1-10 - [i11]Georg Hahn, Muhammad Ali Siddiqi, Said Hamdioui, Wouter A. Serdijn, Christos Strydis:
Assessing the Security of the IEEE 802.15.6 Standard for Medical BANs. CoRR abs/2201.06354 (2022) - [i10]Taha Shahroodi, Mahdi Zahedi, Can Firtina, Mohammed Alser, Stephan Wong, Onur Mutlu, Said Hamdioui:
Demeter: A Fast and Energy-Efficient Food Profiler using Hyperdimensional Computing in Memory. CoRR abs/2206.01932 (2022) - [i9]Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Survey on Architectural Attacks: A Unified Classification and Attack Model. CoRR abs/2208.14194 (2022) - [i8]Mahdi Zahedi, Taha Shahroodi, Stephan Wong, Said Hamdioui:
BCIM: Efficient Implementation of Binary Neural Network Based on Computation in Memory. CoRR abs/2211.06261 (2022) - [i7]Manil Dev Gomony, Floran de Putter, Anteneh Gebregiorgis, Gianna Paulin, Linyan Mei, Vikram Jain, Said Hamdioui, Victor Sanchez, Tobias Grosser, Marc Geilen, Marian Verhelst, Frank K. Zenke, Frank K. Gürkaynak, Barry de Bruin, Sander Stuijk, Simon Davidson, Sayandip De, Mounir Ghogho, Alexandra Jimborean, Sherif Eissa, Luca Benini, Dimitrios Soudris, Rajendra Bishnoi, S. Ainsworth, Federico Corradi, Ouassim Karrakchou, Tim Güneysu, Henk Corporaal:
CONVOLVE: Smart and seamless design of smart edge processors. CoRR abs/2212.00873 (2022) - [i6]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. CoRR abs/2212.09356 (2022) - 2021
- [j52]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021) - [j51]Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke:
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37(4): 427-437 (2021) - [j50]Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana, Said Hamdioui:
Spin Wave Normalization Toward All Magnonic Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 68(1): 536-549 (2021) - [j49]Abhairaj Singh, Muath Abu Lebdeh, Anteneh Gebregiorgis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui:
SRIF: Scalable and Reliable Integrate and Fire Circuit ADC for Memristor-Based CIM Architectures. IEEE Trans. Circuits Syst. I Regul. Pap. 68(5): 1917-1930 (2021) - [j48]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9(2): 707-723 (2021) - [j47]Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui:
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1271-1284 (2021) - [j46]Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Applying Thermal Side-Channel Attacks on Asymmetric Cryptography. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1930-1942 (2021) - [c216]Sumit Diware, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi:
Unbalanced Bit-slicing Scheme for Accurate Memristor-based Neural Network Architecture. AICAS 2021: 1-4 - [c215]Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda:
GRINCH: A Cache Attack against GIFT Lightweight Cipher. DATE 2021: 549-554 - [c214]Abdulqader Nael Mahmoud, Christoph Adelmann, Frederic Vanderveken, Sorin Cotofana, Florin Ciubotaru, Said Hamdioui:
Fan-out of 2 Triangle Shape Spin Wave Logic Gates. DATE 2021: 948-953 - [c213]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. DATE 2021: 1717-1722 - [c212]Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau:
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. DATE 2021: 1877-1880 - [c211]Shubham Rai, Mengyun Liu, Anteneh Gebregiorgis, Debjyoti Bhattacharjee, Krishnendu Chakrabarty, Said Hamdioui, Anupam Chattopadhyay, Jens Trommer, Akash Kumar:
Perspectives on Emerging Computation-in-Memory Paradigms. DATE 2021: 1925-1934 - [c210]Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu:
Modeling Soft-Error Reliability Under Variability. DFT 2021: 1-6 - [c209]Troya Çagil Köylü, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Protecting IoT Devices through a Hardware-driven Memory Verification. DSD 2021: 115-122 - [c208]Luíza C. Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepúlveda:
Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. DSD 2021: 514-518 - [c207]Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks. DTIS 2021: 1-6 - [c206]G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui:
Improving the Detection of Undefined State Faults in FinFET SRAMs. DTIS 2021: 1-6 - [c205]Mottaqiallah Taouil, Abdullah Aljuffri, Said Hamdioui:
Power Side Channel Attacks: Where Are We Standing? DTIS 2021: 1-6 - [c204]Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels:
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*. ETS 2021: 1-10 - [c203]Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Intermittent Undefined State Fault in RRAMs. ETS 2021: 1-6 - [c202]G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui:
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS 2021: 1-6 - [c201]Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui:
Spin Wave Based 4-2 Compressor. ICECS 2021: 1-4 - [c200]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer:
Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs. IOLTS 2021: 1-7 - [c199]Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui:
Spin Wave Based Full Adder. ISCAS 2021: 1-5 - [c198]Abhairaj Singh, Sumit Diware, Anteneh Gebregiorgis, Rajendra Bishnoi, Francky Catthoor, Rajiv V. Joshi, Said Hamdioui:
Low-Power Memristor-Based Computing for Edge-AI Applications. ISCAS 2021: 1-5 - [c197]Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana:
Achieving Wave Pipelining in Spin Wave Technology. ISQED 2021: 54-59 - [c196]Mahdi Zahedi, Remon van Duijnen, Stephan Wong, Said Hamdioui:
Tile Architecture and Hardware Implementation for Computation-in-Memory. ISVLSI 2021: 108-113 - [c195]Mottaqiallah Taouil, Cezar Reinbrecht, Said Hamdioui, Johanna Sepúlveda:
LightRoAD: Lightweight Rowhammer Attack Detector. ISVLSI 2021: 362-367 - [c194]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. ITC 2021: 143-152 - [c193]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer:
An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. ITC 2021: 329-333 - [c192]E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani:
Evaluating the Impact of Process Variation on RRAMs. LATS 2021: 1-6 - [c191]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. PST 2021: 1-10 - [c190]Hussam Amrouch, Nan Du, Anteneh Gebregiorgis, Said Hamdioui, Ilia Polian:
Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures. VLSI-SoC 2021: 1-6 - [c189]Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. VTS 2021: 1-6 - 2020
- [j45]Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). IEEE Access 8: 137263-137274 (2020) - [j44]Iason Giannopoulos, Abhairaj Singh, Manuel Le Gallo, Vara Prasad Jonnalagadda, Said Hamdioui, Abu Sebastian:
In-Memory Database Query. Adv. Intell. Syst. 2(12): 2000141 (2020) - [j43]Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui, Francky Catthoor:
A Classification of Memory-Centric Computing. ACM J. Emerg. Technol. Comput. Syst. 16(2): 13:1-13:26 (2020) - [j42]Jintao Yu, Razvan Nane, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui, Henk Corporaal, Koen Bertels:
Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures. IEEE Trans. Emerg. Top. Comput. 8(2): 545-558 (2020) - [c188]Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui:
The Power of Computation-in-Memory Based on Memristive Devices. ASP-DAC 2020: 385-392 - [c187]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. DATE 2020: 388-393 - [c186]Abdulqader Nael Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui:
n-bit Data Parallel Spin Wave Logic Gate. DATE 2020: 642-645 - [c185]Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui:
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. DATE 2020: 792-797 - [c184]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Impact of Magnetic Coupling and Density on STT-MRAM Performance. DATE 2020: 1211-1216 - [c183]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Mitigation of Sense Amplifier Degradation Using Skewed Design. DATE 2020: 1614-1617 - [c182]Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
A Security Verification Template to Assess Cache Architecture Vulnerabilities. DDECS 2020: 1-6 - [c181]Dario Mamone, Alberto Bosio, Alessandro Savino, Said Hamdioui, Maurizio Rebaudengo:
On the Analysis of Real-time Operating System Reliability in Embedded Systems. DFT 2020: 1-6 - [c180]Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Lima, Said Hamdioui:
Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms. DTIS 2020: 1-2 - [c179]Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
eSRAM Reliability: Why is it still not optimally solved? DTIS 2020: 1-6 - [c178]Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi B. Tahoori, Mottaqiallah Taouil, Said Hamdioui:
Testing Scouting Logic-Based Computation-in-Memory Architectures. ETS 2020: 1-6 - [c177]Bruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
G-PUF: An Intrinsic PUF Based on GPU Error Signatures. ETS 2020: 1-2 - [c176]Shayesteh Masoumian, Georgios N. Selimis, Roel Maes, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling Static Noise Margin for FinFET based SRAM PUFs. ETS 2020: 1-6 - [c175]Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepúlveda:
LiD-CAT: A Lightweight Detector for Cache ATtacks. ETS 2020: 1-6 - [c174]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer:
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. ETS 2020: 1-6 - [c173]Lizhou Wu, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. ETS 2020: 1-2 - [c172]Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana:
4-output Programmable Spin Wave Logic Gate. ICCD 2020: 332-335 - [c171]Vishal Gupta, Saurabh Khandelwal, Giulio Panunzi, Eugenio Martinelli, Said Hamdioui, Abusaleh M. Jabir, Marco Ottavi:
Yield Estimation of a Memristive Sensor Array. IOLTS 2020: 1-2 - [c170]Troya Çagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
RNN-Based Detection of Fault Attacks on RSA. ISCAS 2020: 1-5 - [c169]Abdulqader Nael Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana, Said Hamdioui:
2-Output Spin Wave Programmable Logic Gate. ISVLSI 2020: 60-65 - [c168]Mahdi Zahedi, Mahta Mayahinia, Muath Abu Lebdeh, Stephan Wong, Said Hamdioui:
Efficient Organization of Digital Periphery to Support Integer Datatype for Memristor-Based CIM. ISVLSI 2020: 216-221 - [c167]Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Bruno Forlin, Johanna Sepúlveda:
Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs. ISVLSI 2020: 536-541 - [c166]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. ITC 2020: 1-10 - [c165]Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6 - [c164]Abdullah Aljuffri, Pradeep Venkatachalam, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX. SAMOS 2020: 295-307 - [c163]Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui:
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS 2020: 1-10 - [c162]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sánchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer:
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. VTS 2020: 1-9 - [i5]Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui:
Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests. CoRR abs/2001.05463 (2020) - [i4]Haji Akhundov, Erik van der Sluis, Said Hamdioui, Mottaqiallah Taouil:
Public-Key Based Authentication Architecture for IoT Devices Using PUF. CoRR abs/2002.01277 (2020) - [i3]Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Impact of Magnetic Coupling and Density on STT-MRAM Performance. CoRR abs/2011.11349 (2020)
2010 – 2019
- 2019
- [j41]Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui:
Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era. IEEE Access 7: 33115-33129 (2019) - [j40]Hassen Aziza, Christian Dufaza, Annie Pérez, Said Hamdioui:
Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs. J. Circuits Syst. Comput. 28(13): 1950216:1-1950216:14 (2019) - [j39]Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui:
System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation. J. Low Power Electron. 15(1): 1-10 (2019) - [j38]Elena Ioana Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui:
Challenges and Solutions in Emerging Memory Testing. IEEE Trans. Emerg. Top. Comput. 7(3): 493-506 (2019) - [j37]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1308-1321 (2019) - [c161]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer:
Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification. ATS 2019: 129-134 - [c160]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE 2019: 162-167 - [c159]Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando García-Redondo, Geethan Karunaratne, Abbas Rahimi, Luca Benini:
Applications of Computation-In-Memory Architectures based on Memristive Devices. DATE 2019: 486-491 - [c158]Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
Time-division Multiplexing Automata Processor. DATE 2019: 794-799 - [c157]Alberto Bosio, Ian O'Connor, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Elena I. Vatajelu, Giorgio Di Natale, Lorena Anghel, Surya Nagarajan, Moritz Fieback, Said Hamdioui:
Rebooting Computing: The Challenges for Test and Reliability. DFT 2019: 8138-8143 - [c156]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS 2019: 1-6 - [c155]Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui:
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS 2019: 1-2 - [c154]Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar:
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS 2019: 1-6 - [c153]Josie E. Rodriguez Condia, Felipe Augusto da Silva, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda:
Untestable faults identification in GPGPUs for safety-critical applications. ICECS 2019: 570-573 - [c152]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer:
Efficient Methodology for ISO26262 Functional Safety Verification. IOLTS 2019: 255-256 - [c151]Muath Abu Lebdeh, Uljana Reinsalu, Hoang Anh Du Nguyen, Stephan Wong, Said Hamdioui:
Memristive Device Based Circuits for Computation-in-Memory Architectures. ISCAS 2019: 1-5 - [c150]Anne Siemon, Dirk J. Wouters, Said Hamdioui, Stephan Menzel:
Memristive Device Modeling and Circuit Design Exploration for Computation-in-Memory. ISCAS 2019: 1-5 - [c149]Innocent Okwudili Agbo, Mottaqiallah Taouil, Said Hamdioui:
Reliability Modeling and Mitigation for Embedded Memories. ITC 2019: 1-10 - [c148]Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena Ioana Vatajelu:
IEEE European Test Symposium (ETS). ITC 2019: 1-4 - [c147]Moritz Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, Siddharth Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test: A New Test Approach Towards DPPB Level. ITC 2019: 1-10 - [c146]Said Hamdioui, Moritz Fieback, Surya Nagarajan, Mottaqiallah Taouil:
Testing Computation-in-Memory Architectures Based on Emerging Memories. ITC 2019: 1-10 - [c145]Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui:
Software-Based Mitigation for Memory Address Decoder Aging. LATS 2019: 1-6 - [c144]Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
A computation-in-memory accelerator based on resistive devices. MEMSYS 2019: 19-32 - [c143]Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui:
Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme. NANOARCH 2019: 1-6 - [c142]Ali BanaGozar, Kanishkan Vadivel, Sander Stuijk, Henk Corporaal, Stephan Wong, Muath Abu Lebdeh, Jintao Yu, Said Hamdioui:
CIM-SIM: Computation In Memory SIMuIator. SCOPES 2019: 1-4 - [i2]Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui:
Memristive Devices for Computation-In-Memory. CoRR abs/1907.07898 (2019) - [i1]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. CoRR abs/1912.01561 (2019) - 2018
- [j36]Elena Ioana Vatajelu, Peyman Pouyan, Said Hamdioui:
State of the art and challenges for test and reliability of emerging nonvolatile resistive memories. Int. J. Circuit Theory Appl. 46(1): 4-28 (2018) - [j35]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Impact and mitigation of SRAM read path aging. Microelectron. Reliab. 87: 158-167 (2018) - [j34]G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui:
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. Microelectron. Reliab. 88-90: 355-359 (2018) - [j33]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 311-323 (2018) - [j32]Said Hamdioui, Pierre-Emmanuel Gaillardon, Dietmar Fey, Tajana Simunic Rosing:
Guest Editorial Memristive-Device-Based Computing. IEEE Trans. Very Large Scale Integr. Syst. 26(12): 2581-2583 (2018) - [c141]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Degradation analysis of high performance 14nm FinFET SRAM. DATE 2018: 201-206 - [c140]Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui:
Memristive devices for computation-in-memory. DATE 2018: 1646-1651 - [c139]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10 - [c138]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Testing Resistive Memories: Where are We and What is Missing? ITC 2018: 1-9 - [c137]Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui:
Electrical Modeling of STT-MRAM Defects. ITC 2018: 1-10 - [c136]Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti:
Ionizing radiation modeling in DRAM transistors. LATS 2018: 1-6 - 2017
- [j31]Peyman Pouyan, Esteve Amat, Said Hamdioui, Antonio Rubio:
Resistive Random Access Memory Variability and Its Mitigation Schemes. J. Low Power Electron. 13(1): 124-134 (2017) - [j30]Krishnendu Chakrabarty, Massimo Alioto, Bevan M. Baas, Chirn Chye Boon, Meng-Fan Chang, Naehyuck Chang, Yao-Wen Chang, Chip-Hong Chang, Shih-Chieh Chang, Poki Chen, Masud H. Chowdhury, Pasquale Corsonello, Ibrahim Abe M. Elfadel, Said Hamdioui, Masanori Hashimoto, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Rajiv V. Joshi, Tanay Karnik, Mehran Mozaffari Kermani, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep P. Kulkarni, Eren Kursun, Erik Larsson, Hai (Helen) Li, Huawei Li, Patrick P. Mercier, Prabhat Mishra, Makoto Nagata, Arun S. Natarajan, Koji Nii, Partha Pratim Pande, Ioannis Savidis, Mingoo Seok, Sheldon X.-D. Tan, Mark M. Tehranipoor, Aida Todri-Sanial, Miroslav N. Velev, Xiaoqing Wen, Jiang Xu, Wei Zhang, Zhengya Zhang, Stacey Weber Jackson:
Editorial. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 1-20 (2017) - [j29]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017) - [j28]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels:
On the Implementation of Computation-in-Memory Parallel Adder. IEEE Trans. Very Large Scale Integr. Syst. 25(8): 2206-2219 (2017) - [j27]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. 25(12): 3464-3472 (2017) - [c135]Said Hamdioui, Peyman Pouyan, Huawei Li, Ying Wang, Arijit Raychowdhury, Insik Yoon:
Test and Reliability of Emerging Non-volatile Memories. ATS 2017: 175-183 - [c134]Said Hamdioui, Shahar Kvatinsky, Gert Cauwenberghs, Lei Xie, Nimrod Wald, Siddharth Joshi, Hesham Mostafa Elsayed, Henk Corporaal, Koen Bertels:
Memristor for computing: Myth or reality? DATE 2017: 722-731 - [c133]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Mitigation of sense amplifier degradation using input switching. DATE 2017: 858-863 - [c132]Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui:
On the robustness of memristor based logic gates. DDECS 2017: 158-163 - [c131]Prashant D. Joshi, Arunabha Sen, D. Frank Hsu, Said Hamdioui, Koen Bertels:
Region based containers - A new paradigm for the analysis of fault tolerant networks. DFT 2017: 1-4 - [c130]Mario Barbareschi, Alberto Bosio, Hoang Anh Du Nguyen, Said Hamdioui, Marcello Traiola, Elena Ioana Vatajelu:
Memristive devices: Technology, design automation and computing frontiers. DTIS 2017: 1-8 - [c129]Hoang Anh Du Nguyen, Lei Xie, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui:
Interconnect networks for resistive computing architectures. DTIS 2017: 1-6 - [c128]Cleo Sgouropoulou, Ioannis Voyiatzis, Anastasios Koutoumanos, Said Hamdioui, Peyman Pouyan, M. Comte, Paolo Prinetto, Giuseppe Airo Farulla, Peeter Ellervee, Carlos Delgado Kloos, Raquel M. Crespo García:
Standards-based tools and services for building lifelong learning pathways. EDUCON 2017: 1619-1621 - [c127]Prashant D. Joshi, D. Frank Hsu, Arunabha Sen, Said Hamdioui, Koen Bertels:
Tight Bounds in Message Delays Despite Faults in a Class of Line Digraph Networks. ISPAN-FCST-ISCC 2017: 60-65 - [c126]Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Ali Kaichouhi, Mottaqiallah Taouil, Mohammad AlFailakawi, Said Hamdioui:
Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing. ISVLSI 2017: 176-181 - [c125]Hoang Anh Du Nguyen, Jintao Yu, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Dietmar Fey:
Memristive devices for computing: Beyond CMOS and beyond von Neumann. VLSI-SoC 2017: 1-10 - 2016
- [j26]Georgios Ch. Sirakoulis, Said Hamdioui:
Editorial Note on Memristor Models, Circuits and Architectures. Int. J. Unconv. Comput. 12(4): 247-250 (2016) - [j25]Alberto Scionti, Somnath Mazumdar, Stefano Di Carlo, Said Hamdioui:
SIERRA - Simulation environment for memory redundancy algorithms. Simul. Model. Pract. Theory 69: 14-30 (2016) - [j24]Ioannis Vourkas, Dimitrios Stathis, Georgios Ch. Sirakoulis, Said Hamdioui:
Alternative Architectures Toward Reliable Memristive Crossbar Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(1): 206-217 (2016) - [c124]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor:
Comparative BTI analysis for various sense amplifier designs. DDECS 2016: 68-73 - [c123]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Boolean logic gate exploration for memristor crossbar. DTIS 2016: 1-6 - [c122]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Read path degradation analysis in SRAM. ETS 2016: 1-2 - [c121]Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos:
ETS 2016 foreword. ETS 2016: 1 - [c120]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels, Mohammad AlFailakawi:
Non-volatile look-up table based FPGA implementations. IDT 2016: 165-170 - [c119]Adib Haron, Jintao Yu, Razvan Nane, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Parallel matrix multiplication on memristor-based computation-in-memory architecture. HPCS 2016: 759-766 - [c118]Anteneh Gebregiorgis, Fabian Oboril, Mehdi Baradaran Tahoori, Said Hamdioui:
Instruction cache aging mitigation through Instruction Set Encoding. ISQED 2016: 325-330 - [c117]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene:
Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. ISVLSI 2016: 725-730 - [c116]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Synthesizing HDL to memristor technology: A generic framework. NANOARCH 2016: 43-48 - [c115]Jintao Yu, Razvan Nane, Adib Haron, Said Hamdioui, Henk Corporaal, Koen Bertels:
Skeleton-based design and simulation flow for Computation-in-Memory architectures. NANOARCH 2016: 165-170 - [c114]Peyman Pouyan, Esteve Amat, Said Hamdioui, Antonio Rubio:
RRAM variability and its mitigation schemes. PATMOS 2016: 141-146 - 2015
- [j23]Marco Ottavi, Salvatore Pontarelli, Dimitris Gizopoulos, Cristiana Bolchini, Maria K. Michael, Lorena Anghel, Mehdi Baradaran Tahoori, Antonis M. Paschalis, Pedro Reviriego, Oliver Bringmann, Viacheslav Izosimov, Hans A. R. Manhaeve, Christos Strydis, Said Hamdioui:
Dependable Multicore Architectures at Nanoscale: The View From Europe. IEEE Des. Test 32(2): 17-28 (2015) - [j22]Christos Papameletis, Brion L. Keller, Vivek Chickermane, Said Hamdioui, Erik Jan Marinissen:
A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers. IEEE Des. Test 32(4): 40-48 (2015) - [j21]Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron:
Testing Open Defects in Memristor-Based Memories. IEEE Trans. Computers 64(1): 247-259 (2015) - [j20]Mafalda Cortez, Said Hamdioui, Ali Kaichouhi, Vincent van der Leest, Roel Maes, Geert Jan Schrijen:
Intelligent Voltage Ramp-Up Time Adaptation for Temperature Noise Reduction on Memory-Based PUF Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(7): 1162-1175 (2015) - [j19]Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen:
Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(11): 1860-1872 (2015) - [j18]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching. ACM Trans. Design Autom. Electr. Syst. 20(2): 19:1-19:23 (2015) - [c113]Anteneh Gebregiorgis, Mojtaba Ebrahimi, Saman Kiamehr, Fabian Oboril, Said Hamdioui, Mehdi Baradaran Tahoori:
Aging mitigation in memory arrays using self-controlled bit-flipping technique. ASP-DAC 2015: 231-236 - [c112]Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk J. Wouters, Eike Linn, Jan van Lunteren:
Memristor based computation-in-memory architecture for data-intensive applications. DATE 2015: 1718-1725 - [c111]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Stefan Cosemans, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. DTIS 2015: 1-6 - [c110]Said Hamdioui:
Electronics and computing in nano-era: The good, the bad and the challenging. DTIS 2015: 1 - [c109]Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui:
On resistive open defect detection in DRAMs: The charge accumulation effect. ETS 2015: 1-6 - [c108]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Said Hamdioui:
Fast boolean logic mapped on memristor crossbar. ICCD 2015: 335-342 - [c107]Said Hamdioui:
Keynote 2: "Computing for big-data: Beyond CMOS and beyond Von-Neumann". IDT 2015: 1 - [c106]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
BTI analysis of SRAM write driver. IDT 2015: 100-105 - [c105]Paolo Bernardi, Lyl M. Ciganda Brasca, Matteo Sonza Reorda, Said Hamdioui:
SW-based transparent in-field memory testing. LATS 2015: 1-6 - [c104]Mafalda Cortez, Said Hamdioui, Ryoichi Ishihara:
Design dependent SRAM PUF robustness analysis. LATS 2015: 1-6 - [c103]Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels:
Computation-in-memory based parallel adder. NANOARCH 2015: 57-62 - [c102]Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels:
Interconnect networks for memristor crossbar. NANOARCH 2015: 124-129 - [c101]Said Hamdioui:
Computation in Memory for Data-Intensive Applications: Beyond CMOS and beyond Von- Neumann. SCOPES 2015: 1 - [c100]Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. VTS 2015: 1-6 - 2014
- [j17]Mafalda Cortez, Gijs Roelofs, Said Hamdioui, Giorgio Di Natale:
Testing Methods for PUF-Based Secure Key Storage Circuits. J. Electron. Test. 30(5): 581-594 (2014) - [j16]Yiorgos Sfikas, Yiorgos Tsiatouhas, Said Hamdioui:
Layout-Based Refined NPSF Model for DRAM Characterization and Testing. IEEE Trans. Very Large Scale Integr. Syst. 22(6): 1446-1450 (2014) - [c99]Prashant D. Joshi, Arunabha Sen, Said Hamdioui, Koen Bertels:
Region Disjoint Paths in a Class of Optimal Line Graph Networks. CSE 2014: 1256-1260 - [c98]Mafalda Cortez, Gijs Roelofs, Said Hamdioui, Giorgio Di Natale:
Testing PUF-based secure key storage circuits. DATE 2014: 1-6 - [c97]Said Hamdioui, Jean-Luc Danger, Giorgio Di Natale, Fethulah Smailbegovic, Gerard van Battum, Mark M. Tehranipoor:
Hacking and protecting IC hardware. DATE 2014: 1-7 - [c96]Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor:
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE 2014: 1-6 - [c95]Mottaqiallah Taouil, Mahmoud Masadeh, Said Hamdioui, Erik Jan Marinissen:
Interconnect test for 3D stacked memory-on-logic. DATE 2014: 1-6 - [c94]Prashant D. Joshi, Said Hamdioui:
Security methods in fault tolerant modified line graph based networks. DFT 2014: 57-62 - [c93]Prashant D. Joshi, Said Hamdioui:
Shortest path reduction in a class of uniform fault tolerant networks. DFT 2014: 234-239 - [c92]Said Hamdioui:
3D/ 2.5D stacked IC cost modeling and test flow selection. DTIS 2014: 1 - [c91]Said Hamdioui, Hassan Aziza, Georgios Ch. Sirakoulis:
Memristor based memories: Technology, design and test. DTIS 2014: 1-7 - [c90]Prashant D. Joshi, Said Hamdioui:
Line graph based fast rerouting and reconfiguration for handling transient and permanent node failures. HPSR 2014: 167-172 - [c89]Erik Jan Marinissen, Bart De Wachter, Ken Smith, Jorg Kiesewetter, Mottaqiallah Taouil, Said Hamdioui:
Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. ITC 2014: 1-10 - [c88]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
Quality versus cost analysis for 3D Stacked ICs. VTS 2014: 1-6 - 2013
- [j15]Dimitris Gizopoulos, Said Hamdioui, Hans A. R. Manhaeve:
Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN). J. Electron. Test. 29(2): 125-126 (2013) - [c87]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik:
Using 3D-COSTAR for 2.5D test cost optimization. 3DIC 2013: 1-8 - [c86]Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui:
An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium 2013: 227-232 - [c85]Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Guido Groeseneken, Philippe Bonnot:
Reliability challenges of real-time systems in forthcoming technology nodes. DATE 2013: 129-134 - [c84]Mihai Lefter, George Razvan Voicu, Mottaqiallah Taouil, Marius Enachescu, Said Hamdioui, Sorin Dan Cotofana:
Is TSV-based 3D integration suitable for inter-die memory repair? DATE 2013: 1251-1254 - [c83]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen, Sudipta Bhawmik:
Impact of mid-bond testing in 3D stacked ICs. DFTS 2013: 178-183 - [c82]Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman:
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS 2013: 1 - [c81]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Bias temperature instability analysis in SRAM decoder. ETS 2013: 1 - [c80]Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui:
Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. ETS 2013: 1-6 - [c79]Mafalda Cortez, Said Hamdioui, Vincent van der Leest, Roel Maes, Geert Jan Schrijen:
Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs. HOST 2013: 35-40 - [c78]Innocent Agbo, Seyab Khan, Said Hamdioui:
BTI impact on SRAM sense amplifier. IDT 2013: 1-6 - [c77]Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. IDT 2013: 1-6 - [c76]Sohaib Majzoub, Zaid Al-Ars, Said Hamdioui:
Reducing random-dopant fluctuation impact on core-speed and power variability in many-core platforms. IDT 2013: 1-6 - [c75]Mottaqiallah Taouil, Mihai Lefter, Said Hamdioui:
Exploring test opportunities for memory and interconnects in 3D ICs. IDT 2013: 1-6 - 2012
- [j14]Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen:
Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost. J. Electron. Test. 28(1): 15-25 (2012) - [j13]Mottaqiallah Taouil, Said Hamdioui:
Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. J. Electron. Test. 28(4): 523-534 (2012) - [c74]Nor Zaidi Haron, Said Hamdioui:
DfT schemes for resistive open defects in RRAMs. DATE 2012: 799-804 - [c73]Said Hamdioui:
TSV based 3D stacked ICs: Opportunities and challenges. DDECS 2012: 2 - [c72]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
BTI impact on logical gates in nano-scale CMOS technology. DDECS 2012: 348-353 - [c71]Mafalda Cortez, Apurva Dargar, Said Hamdioui, Geert Jan Schrijen:
Modeling SRAM start-up behavior for Physical Unclonable Functions. DFT 2012: 1-6 - [c70]Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor:
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. DFT 2012: 158-163 - [c69]Mottaqiallah Taouil, Said Hamdioui:
On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs. DTIS 2012: 1-6 - [c68]Ioannis Voyiatzis, Costas Efstathiou, Said Hamdioui, Cleo Sgouropoulou:
ALU based address generation for RAMs. DTIS 2012: 1-6 - [c67]Said Hamdioui, Rob Aitken:
VLSI Test technology: Why is the field not sexy enough? ETS 2012: 1 - [c66]Said Hamdioui:
Testing Embedded Memories: A Survey. MEMICS 2012: 32-42 - 2011
- [j12]Nor Zaidi Haron, Said Hamdioui:
Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories. ACM J. Emerg. Technol. Comput. Syst. 7(1): 4:1-4:19 (2011) - [c65]Said Hamdioui, Venkataraman Krishnaswami, Ijeoma Sandra Irobi, Zaid Al-Ars:
A New Test Paradigm for Semiconductor Memories in the Nano-Era. Asian Test Symposium 2011: 347-352 - [c64]Nor Zaidi Haron, Said Hamdioui:
On Defect Oriented Testing for Hybrid CMOS/Memristor Memory. Asian Test Symposium 2011: 353-358 - [c63]Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Claude Thibeault:
Testing for Parasitic Memory Effect in SRAMs. Asian Test Symposium 2011: 407-412 - [c62]Said Hamdioui, Mottaqiallah Taouil:
Yield Improvement and Test Cost Optimization for 3D Stacked ICs. Asian Test Symposium 2011: 480-485 - [c61]Nor Zaidi Haron, Said Hamdioui:
Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories. DATE 2011: 265-268 - [c60]Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell:
Influence of parasitic memory effect on single-cell faults in SRAMs. DDECS 2011: 159-162 - [c59]Mottaqiallah Taouil, Said Hamdioui:
Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. DDECS 2011: 335-340 - [c58]Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor:
NBTI Monitoring and Design for Reliability in Nanoscale Circuits. DFT 2011: 68-76 - [c57]Ahmed Awad, Abdallatif S. Abu-Issa, Said Hamdioui:
Reducing Test Power for Embedded Memories. DFT 2011: 112-119 - [c56]Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui:
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145 - [c55]Mottaqiallah Taouil, Said Hamdioui:
Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. ETS 2011: 45-50 - [c54]Sandra Irobi, Zaid Al-Ars, Said Hamdioui:
Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. ETS 2011: 205 - [c53]Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen:
On modeling and optimizing cost in 3D Stacked-ICs. IDT 2011: 24-29 - [c52]Seyab Khan, Said Hamdioui:
ReverseAge: An online NBTI combating technique using time borrowing. IDT 2011: 36-41 - [c51]Seyab Khan, Said Hamdioui:
Modeling and mitigating NBTI in nanoscale circuits. IOLTS 2011: 1-6 - [c50]Ad J. van de Goor, Said Hamdioui, Halil Kukner:
Generic, orthogonal and low-cost March Element based memory BIST. ITC 2011: 1-10 - 2010
- [c49]Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen:
Test Cost Analysis for 3D Die-to-Wafer Stacking. Asian Test Symposium 2010: 435-441 - [c48]Ad J. van de Goor, Georgi Gaydadjiev, Said Hamdioui:
Memory testing with a RISC microcontroller. DATE 2010: 214-219 - [c47]Seyab, Said Hamdioui:
NBTI modeling in the framework of temperature variation. DATE 2010: 283-286 - [c46]Said Hamdioui, Ad J. van de Goor:
Advanced embedded memory testing: Reducing the defect per million level at lower test cost. DDECS 2010: 7 - [c45]Ad J. van de Goor, Said Hamdioui, Georgi Gaydadjiev:
Using a CISC microcontroller to test embedded memories. DDECS 2010: 261-266 - [c44]Ad J. van de Goor, Christian Jung, Said Hamdioui, Georgi Gaydadjiev:
Low-cost, customized and flexible SRAM MBIST engine. DDECS 2010: 382-387 - [c43]Nor Zaidi Haron, Said Hamdioui:
High-Performance Cluster-Fault Tolerance Scheme for Hybrid Nanoelectronic Memories. DFT 2010: 144-151 - [c42]Nor Zaidi Haron, Said Hamdioui, Zaiyan Ahyadi:
ECC design for fault-tolerant crossbar memories: A case study. IDT 2010: 61-66 - [c41]Ad J. van de Goor, Said Hamdioui:
MBIST architecture framework based on orthogonal constructs. IDT 2010: 128-133 - [c40]Seyab Khan, Said Hamdioui:
Temperature dependence of NBTI induced delay. IOLTS 2010: 15-20 - [c39]Mottaqiallah Taouil, Said Hamdioui, Jouke Verbree, Erik Jan Marinissen:
On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. ITC 2010: 183-192 - [c38]Sandra Irobi, Zaid Al-Ars, Said Hamdioui:
Detecting memory faults in the presence of bit line coupling in SRAM devices. ITC 2010: 437-446 - [c37]Sandra Irobi, Zaid Al-Ars, Said Hamdioui:
Bit line coupling memory tests for single-cell fails in SRAMs. VTS 2010: 27-32
2000 – 2009
- 2009
- [j11]Demid Borodin, Ben H. H. Juurlink, Said Hamdioui, Stamatis Vassiliadis:
Instruction-Level Fault Tolerance Configurability. J. Signal Process. Syst. 57(1): 89-105 (2009) - [c36]Said Hamdioui:
Testing Embedded Memories in the Nano-Era: Will the Existing Approaches Survive?. Asian Test Symposium 2009: 339 - [c35]Ad J. van de Goor, Said Hamdioui, Georgi Nedeltchev Gaydadjiev, Zaid Al-Ars:
New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults. Asian Test Symposium 2009: 391-396 - [c34]Zaid Al-Ars, Said Hamdioui:
Fault Diagnosis Using Test Primitives in Random Access Memories. Asian Test Symposium 2009: 403-408 - [c33]Nor Zaidi Haron, Said Hamdioui:
Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories. DFT 2009: 85-93 - [c32]Nor Zaidi Haron, Said Hamdioui:
Residue-based code for reliable hybrid memories. NANOARCH 2009: 27-32 - [c31]Nor Zaidi Haron, Said Hamdioui, Sorin Cotofana:
Emerging non-CMOS nanoelectronic devices - What are they?. NEMS 2009: 63-68 - 2008
- [j10]Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Stamatis Vassiliadis:
Test Set Development for Cache Memory in Modern Microprocessors. IEEE Trans. Very Large Scale Integr. Syst. 16(6): 725-732 (2008) - [c30]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georg Mueller:
Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. ITC 2008: 1-10 - 2007
- [c29]Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev:
Manifestation of Precharge Faults in High Speed DRAM Devices. DDECS 2007: 179-184 - [c28]Said Hamdioui, Zaid Al-Ars, Javier Jiménez, Jose Calero:
PPM Reduction on Embedded Memories in System on Chip. ETS 2007: 85-90 - [c27]Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev:
Optimizing Test Length for Soft Faults in DRAM Devices. VTS 2007: 59-66 - 2006
- [j9]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor:
Opens and Delay Faults in CMOS RAM Address Decoders. IEEE Trans. Computers 55(12): 1630-1639 (2006) - [j8]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Sultan M. Al-Harbi:
Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(12): 2989-2996 (2006) - [c26]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor:
Space of DRAM fault models and corresponding testing. DATE 2006: 1252-1257 - [c25]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georgi Gaydadjiev, Jörg E. Vollrath:
DRAM-Specific Space of Memory Tests. ITC 2006: 1-10 - 2005
- [j7]Said Hamdioui, John Eleazar Q. Delos Reyes:
New data-background sequences and their industrial evaluation for word-oriented random-access memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 892-904 (2005) - [c24]Zaid Al-Ars, Said Hamdioui, Jörg E. Vollrath:
Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach. Asian Test Symposium 2005: 434-439 - [c23]Zaid Al-Ars, Said Hamdioui, Georg Mueller, Ad J. van de Goor:
Framework for Fault Analysis and Test Generation in DRAMs. DATE 2005: 1020-1021 - [c22]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Rob Wadsworth:
Impact of stresses on the fault coverage of memory tests. MTDT 2005: 103-108 - 2004
- [j6]Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor:
Memory Fault Modeling Trends: A Case Study. J. Electron. Test. 20(3): 245-255 (2004) - [j5]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 737-757 (2004) - [c21]Said Hamdioui, John Delos Reyes, Zaid Al-Ars:
Evaluation of Intra-Word Faults in Word-Oriented RAMs. Asian Test Symposium 2004: 283-288 - [c20]Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars:
Tests for address decoder delay faults in RAMs due to inter-gate opens. ETS 2004: 146-151 - [c19]Ad J. van de Goor, Said Hamdioui, Rob Wadsworth:
Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. ITC 2004: 114-123 - [c18]Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars:
The Effectiveness of the Scan Test and Its New Variants. MTDT 2004: 26-31 - [c17]Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor:
The State-of-Art and Future Trends in Testing Embedded Memories. MTDT 2004: 54-59 - [c16]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor:
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. VTS 2004: 117-122 - 2003
- [j4]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electron. Test. 19(2): 195-205 (2003) - [c15]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
March SL: A Test For All Static Linked Memory Faults. Asian Test Symposium 2003: 372-377 - [c14]Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor:
Importance of dynamic faults for new SRAM technologies. ETW 2003: 29-34 - [c13]Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor:
A Fault Primitive Based Analysis of Linked Faults in RAMs. MTDT 2003: 33- - [c12]Said Hamdioui, Ad J. van de Goor, Mike Rodgers:
Detecting Intra-Word Faults in Word-Oriented Memories. VTS 2003: 241-247 - 2002
- [j3]Said Hamdioui, Ad J. van de Goor:
Efficient Tests for Realistic Faults in Dual-Port SRAMs. IEEE Trans. Computers 51(5): 460-473 (2002) - [j2]Said Hamdioui, Ad J. van de Goor:
Thorough testing of any multiport memory with linear tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(2): 217-231 (2002) - [c11]Said Hamdioui, Ad J. van de Goor, Mike Rodgers:
March SS: A Test for All Static Simple RAM Faults. MTDT 2002: 95-100 - [c10]Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor:
Testing Static and Dynamic Faults in Random Access Memories. VTS 2002: 395-400 - 2001
- [c9]Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers:
Detecting Unique Faults in Multi-port SRAMs. Asian Test Symposium 2001: 37-42 - [c8]Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers:
Realistic Fault Models and Test Procedures for Multi-Port SRAMs. MTDT 2001: 65-72 - 2000
- [j1]Said Hamdioui, Ad J. van de Goor:
Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. J. Electron. Test. 16(5): 487-498 (2000) - [c7]Said Hamdioui, Ad J. van de Goor:
An experimental analysis of spot defects in SRAMs: realistic fault models and tests. Asian Test Symposium 2000: 131-138 - [c6]Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick:
March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78
1990 – 1999
- 1999
- [c5]Said Hamdioui, Ad J. van de Goor:
March Tests for Word-Oriented Two-Port Memories. Asian Test Symposium 1999: 53- - [c4]Said Hamdioui, Ad J. van de Goor:
Port interference faults in two-port memories. ITC 1999: 1001-1010 - 1998
- [c3]Said Hamdioui, Ad J. van de Goor:
Consequences of Port Restriction on Testing Address Decoders in Two-Port Memories. Asian Test Symposium 1998: 340-347 - [c2]Said Hamdioui, Ad J. van de Goor:
Consequences of port restrictions on testing two-port memories. ITC 1998: 63-72 - [c1]Ad J. van de Goor, Said Hamdioui:
Fault Models and Tests for Two-Port Memories. VTS 1998: 401-410
Coauthor Index
Letícia Maria Veiras Bolzani
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
aka: Letícia Maria Veiras Bolzani Poehls
aka: Letícia Maria Bolzani Poehls
aka: Leticia B. Poehls
aka: Leticia Bolzani Poehls
Thiago Copetti
aka: Thiago Santos Copetti
aka: Thiago Santos Copetti
Sorin Cotofana
aka: Sorin Dan Cotofana
aka: Sorin Dan Cotofana
Georgi Gaydadjiev
aka: Georgi Nedeltchev Gaydadjiev
aka: Georgi Nedeltchev Gaydadjiev
G. Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
aka: Guilherme Cardoso Medeiros
Cezar Reinbrecht
aka: Cezar Rodolfo Wedig Reinbrecht
aka: Cezar Rodolfo Wedig Reinbrecht
Mehdi Baradaran Tahoori
aka: Mehdi B. Tahoori
aka: Mehdi B. Tahoori
[j77] [j76] [c270] [c268] [c267] [c266] [c265] [c264] [c263] [i16] [j71] [c258] [c257] [c254] [c252] [c251] [c250] [c249] [c248] [c246] [c245] [c239] [c237] [j67] [j62] [j61] [j60] [j57] [j56] [j55] [c235] [c234] [c232] [c231] [c229] [c228] [c223] [c221] [i9] [i6] [j52] [j48] [j47] [j46] [c215] [c213] [c212] [c209] [c208] [c207] [c206] [c205] [c203] [c202] [c195] [c194] [c191] [c189] [j45] [j43] [j42] [c188] [c187] [c185] [c184] [c183] [c182] [c179] [c178] [c177] [c176] [c175] [c173] [c170] [c167] [c166] [c165] [c164] [i5] [i4] [i3] [j41] [j39] [j38] [j37] [c160] [c159] [c158] [c156] [c155] [c154] [c149] [c147] [c146] [c145] [c144] [c143] [i2] [i1] [j35] [j34] [j33] [c141] [c140] [c139] [c138] [c137] [c136] [j29] [j28] [j27] [c133] [c132] [c129] [c126] [c125] [c124] [c123] [c122] [c120] [c119] [c117] [c116] [j21] [j19] [j18] [c112] [c111] [c109] [c108] [c106] [c103] [c102] [c100] [c95] [c89] [c88] [c87] [c84] [c83] [c77] [c75] [j14] [j13] [c69] [c62] [c59] [c55] [c53] [c49] [c39]
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