"Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing."

Lizhou Wu et al. (2019)

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DOI: 10.1109/ETS.2019.8791518

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar:
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS 2019: 1-6

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