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"Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM."

Daniel Kraak et al. (2019)

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DOI: 10.1109/TVLSI.2019.2902881

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/KraakTAHWCC19
Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1308-1321 (2019)

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