"Tests for address decoder delay faults in RAMs due to inter-gate opens."

Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars (2004)

Details and statistics

DOI: 10.1109/ETSYM.2004.1347646

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics