"On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs."

Mottaqiallah Taouil, Said Hamdioui (2012)

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DOI: 10.1109/DTIS.2012.6232983

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-17

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Mottaqiallah Taouil, Said Hamdioui:
On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs. DTIS 2012: 1-6

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