"Device-Aware Test for Back-Hopping Defects in STT-MRAMs."

Sicong Yuan et al. (2023)

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DOI: 10.23919/DATE56975.2023.10137071

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui:
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE 2023: 1-6

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