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"A New Test Paradigm for Semiconductor Memories in the Nano-Era."

Said Hamdioui et al. (2011)

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DOI: 10.1109/ATS.2011.87

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/HamdiouiKIA11
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  persistent URL:
  - https://dblp.org/rec/conf/ats/HamdiouiKIA11
Said Hamdioui, Venkataraman Krishnaswami, Ijeoma Sandra Irobi, Zaid Al-Ars:
A New Test Paradigm for Semiconductor Memories in the Nano-Era. Asian Test Symposium 2011: 347-352

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