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"Degradation analysis of high performance 14nm FinFET SRAM."

Daniel Kraak et al. (2018)

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DOI: 10.23919/DATE.2018.8342003

access: closed

type: Conference or Workshop Paper

metadata version: 2018-04-24

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  dblp key:
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  - https://dblp.org/rec/conf/date/KraakATHWCC18
Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Degradation analysis of high performance 14nm FinFET SRAM. DATE 2018: 201-206

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