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2010 – 2019
- 2019
[j3]Hassen Aziza
, Christian Dufaza, Annie Pérez, Said Hamdioui:
Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs. J. Circuits Syst. Comput. 28(13): 1950216:1-1950216:14 (2019)- 2018
- [c17]Hassen Aziza, Christian Dufaza, Annie Pérez:
A configurable operational amplifier based on oxide resistive RAMs. DTIS 2018: 1-2 - 2013
- [c16]Jamel Nebhen, Eric Savary, Wenceslas Rahajandraibe, Christian Dufaza, Stéphane Meillére, Fayrouz Haddad, Edith Kussener, Hervé Barthélemy, Jaroslaw Czarny, Andrea Walther:
Low-noise CMOS analog-to-digital interface for MEMS resistive microphone. ICECS 2013: 445-448 - 2011
- [c15]Emmanuel Hardy, Hassan Ihs, Christian Dufaza, Stéphane Meillére, Rachid Bouchakour:
A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ converters. CICC 2011: 1-4
2000 – 2009
- 2007
- [c14]Julien Mercier, Christian Dufaza, Mathieu Lisart:
Signoff power methodology for contactless smartcards. ISLPED 2007: 407-410 - 2006
- [c13]Julien Mercier, Christian Dufaza, Mathieu Lisart:
Methodology for Dynamic Power Verification of Contactless Smartcards. PATMOS 2006: 280-291 - 2002
- [c12]Wenceslas Rahajandraibe, Christian Dufaza, Daniel Auvergne, Bruno Cialdella, Bernard Majoux, Vivek Chowdhury:
Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications. DATE 2002: 316-321
1990 – 1999
- 1999
- [c11]Christian Dufaza:
Multiple Paths Sensitization of Digital Oscillation Built-In Self Test. ICCD 1999: 166-174 - 1998
- [j2]Christian Dufaza:
Theoretical properties of LFSRs for built-in self test. Integr. 25(1): 17-35 (1998) - [c10]Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100 - 1997
- [c9]Christian Dufaza, Yervant Zorian:
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs. ED&TC 1997: 69-76 - [c8]Hassan Ihs, Christian Dufaza:
Test synthesis for DC test of switched-capacitors circuits. ED&TC 1997: 616 - [c7]Christian Dufaza, Hassan Ihs:
Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits. VTS 1997: 252-260 - 1996
- [j1]Christian Dufaza, Hassan Ihs:
A BIST-DFT technique for DC test of analog modules. J. Electron. Test. 9(1-2): 117-133 (1996) - [c6]Christian Dufaza, Hassan Ihs, Nico Verzijp:
Design and experimental results of a built-in voltage sensor for mixed signal testing. ICECS 1996: 1206-1209 - 1995
- [c5]Hassan Ihs, Christian Dufaza:
Tolerance DC bands of CMOS operational amplifier. Asian Test Symposium 1995: 140- - [c4]Christian Dufaza, H. Viallon, Cyril Chevalier:
BIST hardware generator for mixed test scheme. ED&TC 1995: 424-430 - 1993
- [c3]Christian Dufaza, Cyril Chevalier, Lew Fock Chong Lew Yan Voon:
LFSROM an algorithm for automatic design synthesis of hardware test pattern generator. VTS 1993: 208-214 - 1992
- [c2]Lew Fock Chong Lew Yan Voon, Christian Dufaza, Christian Landrault:
Quasi-Linear FSMS and their Application to the Generation of Deterministic and Pseudo-random Test Vectors. VLSI Design 1992: 350-351 - [c1]Lew Fock Chong Lew Yan Voon, Christian Dufaza, Christian Landrault:
BIST linear generator based on complemented outputs. VTS 1992: 137-142
Coauthor Index
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