![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
Bram Kruseman
Person information
Refine list
![note](https://dblp.uni-trier.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2016
- [c25]Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos:
ETS 2016 foreword. ETS 2016: 1 - 2015
- [c24]Bram Kruseman:
Testing of Analog/Mixed Signal ICs: Past, present and future. ETS 2015: 1 - 2013
- [j7]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 301-312 (2013) - [c23]Said Hamdioui, Davide Appello
, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman:
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS 2013: 1 - 2012
- [j6]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29(5): 72-80 (2012) - [j5]Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak:
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 809-813 (2012) - [j4]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman:
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61(10): 2701-2712 (2012) - 2011
- [j3]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1911-1922 (2011) - [j2]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2209-2220 (2011) - [c22]Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing:
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE 2011: 371-376 - [c21]Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui:
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145 - [c20]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for analog/mixed-signal devices. ITC 2011: 1-10 - 2010
- [c19]Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel:
NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE 2010: 1373-1376 - [c18]Rosa Rodríguez-Montañés, Daniel Arumí
, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out. ETS 2010: 233-238 - [c17]Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti:
Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
2000 – 2009
- 2008
- [c16]Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi:
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC 2008: 1-10 - [c15]Rosa Rodríguez-Montañés, Daniel Arumí
, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC 2008: 1-10 - [c14]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Full Open Defects in Nanometric CMOS. VTS 2008: 119-124 - 2007
- [j1]Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger:
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24(3): 226-234 (2007) - [c13]Bram Kruseman, Ananta K. Majhi, Guido Gronthoud:
On Performance Testing with Path Delay Patterns. VTS 2007: 29-34 - [c12]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150 - [c11]Rosa Rodríguez-Montañés, Daniel Arumí
, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166 - 2006
- [c10]Bram Kruseman, Manuel Heiligers:
On test conditions for the detection of open defects. DATE 2006: 896-901 - [c9]Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger:
Power Supply Noise in Delay Testing. ITC 2006: 1-10 - 2004
- [c8]Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger:
On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222 - [c7]Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede:
Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299 - [c6]Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge:
Trends in Testing Integrated Circuits. ITC 2004: 688-697 - 2003
- [c5]Bram Kruseman, Stefan van den Oetelaar:
Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875 - 2002
- [c4]Bram Kruseman, Stefan van den Oetelaar, Josep Rius:
Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973 - 2001
- [c3]Bram Kruseman, Rudger van Veen, Kees van Kaam:
The future of delta I_DDQ testing. ITC 2001: 101-110 - 2000
- [c2]Bram Kruseman:
Comparison of defect detection capabilities of current-based and voltage-based test methods. ETW 2000: 175-180
1990 – 1999
- 1999
- [c1]Bram Kruseman, Peter Janssen, Victor Zieren:
Transient current testing of 0.25 μm CMOS devices. ITC 1999: 47-56
Coauthor Index
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-08-08 20:10 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint