"RESCUE: Interdependent Challenges of Reliability, Security and Quality in ..."

Maksim Jenihhin et al. (2019)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2021-04-28

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1912-01561
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1912-01561
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. CoRR abs/1912.01561 (2019)

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