"Advanced embedded memory testing: Reducing the defect per million level at ..."

Said Hamdioui, Ad J. van de Goor (2010)

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DOI: 10.1109/DDECS.2010.5491828

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Said Hamdioui, Ad J. van de Goor:
Advanced embedded memory testing: Reducing the defect per million level at lower test cost. DDECS 2010: 7

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