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ORCIDIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 29
Volume 29, Number 1, January 2010
- Sachin S. Sapatnekar
:
Editorial. 1
- Mesut Meterelliyoz, Jaydeep P. Kulkarni, Kaushik Roy:
Analysis of SRAM and eDRAM Cache Memories Under Spatial Temperature Variations. 2-13 - Sandra Lefteriu, Athanasios C. Antoulas:
A New Approach to Modeling Multiport Systems From Frequency-Domain Data. 14-27 - Joost Rommes, Wil H. A. Schilders:
Efficient Methods for Large Resistor Networks. 28-39 - Tai-Chen Chen, Guang-Wan Liao, Yao-Wen Chang:
Predictive Formulae for OPC With Applications to Lithography-Friendly Routing. 40-50 - Siew-Hong Teh, Chun-Huat Heng, Arthur Tay:
Performance-Based Optical Proximity Correction Methodology. 51-64 - Nick Soveiko, Michel S. Nakhla, Ramachandra Achar:
Comparison Study of Performance of Parallel Steady State Solver on Different Computer Architectures. 65-77 - Chen-Ling Chou, Radu Marculescu:
Run-Time Task Allocation Considering User Behavior in Embedded Multiprocessor Networks-on-Chip. 78-91 - Imad A. Ferzli, Eli Chiprout, Farid N. Najm:
Verification and Codesign of the Package and Die Power Delivery System Using Wavelets. 92-102 - Qiaoyan Yu, Paul Ampadu:
A Flexible Parallel Simulator for Networks-on-Chip With Error Control. 103-116 - Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Compaction Utilizing Inter and Intra-Correlation of Unknown States. 117-126 - Sukanta Das, Biplab K. Sikdar:
A Scalable Test Structure for Multicore Chip. 127-137 - Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster:
Increasing the Efficiency of Simulation-Based Functional Verification Through Unsupervised Support Vector Analysis. 138-148 - Gang Chen:
Formalization of a Parameterized Parallel Adder Within the Coq Theorem Prover. 149-153 - Benjamin Carrión Schäfer, Kazutoshi Wakabayashi:
Design Space Exploration Acceleration Through Operation Clustering. 153-157 - Luís Guerra e Silva, Joel R. Phillips, Luís Miguel Silveira:
Effective Corner-Based Techniques for Variation-Aware IC Timing Verification. 157-162
Volume 29, Number 2, February 2010
- Gi-Joon Nam, Prashant Saxena:
Guest Editorial. 169-170 - Kuang-Yao Lee, Shing-Tung Lin, Ting-Chi Wang:
Enhanced Double Via Insertion Using Wire Bending. 171-184 - Kun Yuan, Jae-Seok Yang, David Z. Pan:
Double Patterning Layout Decomposition for Simultaneous Conflict and Stitch Minimization. 185-196 - Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly:
Layout Generator for Transistor-Level High-Density Regular Circuits. 197-210 - Qunzeng Liu, Sachin S. Sapatnekar:
Capturing Post-Silicon Variations Using a Representative Critical Path. 211-222 - Yifang Liu, Jiang Hu:
A New Algorithm for Simultaneous Gate Sizing and Threshold Voltage Assignment. 223-234 - Quang Dinh, Deming Chen, Martin D. F. Wong:
A Routing Approach to Reduce Glitches in Low Power FPGAs. 235-240 - Chien Pang Lu, Mango Chia-Tso Chao, Chen Hsing Lo, Chih-Wei Chang:
A Metal-Only-ECO Solver for Input-Slew and Output-Loading Violations. 240-245 - Rupesh S. Shelar:
Routing With Constraints for Post-Grid Clock Distribution in Microprocessors. 245-249 - Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimoto, Takashi Sato, Minglu Jiang, Yasuaki Inoue:
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies. 250-260 - Ravikishore Gandikota, Kaviraj Chopra, David T. Blaauw, Dennis Sylvester:
Victim Alignment in Crosstalk-Aware Timing Analysis. 261-274 - Raveendranatha P. Mahesh, A. Prasad Vinod:
New Reconfigurable Architectures for Implementing FIR Filters With Low Complexity. 275-288 - Wen-Wen Hsieh, Shih-Liang Chen, I-Sheng Lin, TingTing Hwang:
A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test. 289-298 - Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Hiroshi Furukawa, Hao-Jan Chao, Boryau Sheu, Jianghao Guo, Wen-Ben Jone:
Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains. 299-312 - Jwu-E Chen, Pei-Wen Luo, Chin-Long Wey:
Placement Optimization for Yield Improvement of Switched-Capacitor Analog Integrated Circuits. 313-318 - Kuang-Yao Lee, Ting-Chi Wang, Cheng-Kok Koh, Kai-Yuan Chao:
Optimal Double Via Insertion With On-Track Preference. 318-323
Volume 29, Number 3, March 2010
- Hao Zheng:
Compositional Reachability Analysis for Efficient Modular Verification of Asynchronous Designs. 329-340 - Ajay Kumar Verma, Philip Brisk, Paolo Ienne:
Fast, Nearly Optimal ISE Identification With I/O Serialization Through Maximal Clique Enumeration. 341-354 - Hyein Lee, Seungwhun Paik, Youngsoo Shin:
Pulse Width Allocation and Clock Skew Scheduling: Optimizing Sequential Circuits Based on Pulsed Latches. 355-366 - Jackey Z. Yan, Chris Chu:
DeFer: Deferred Decision Making Enabled Fixed-Outline Floorplanning Algorithm. 367-381 - Gianpiero Cabodi, Luz Amanda Garcia, Marco Murciano, Sergio Nocco, Stefano Quer:
Partitioning Interpolant-Based Verification for Effective Unbounded Model Checking. 382-395 - Mingsong Chen, Prabhat Mishra:
Functional Test Generation Using Efficient Property Clustering and Learning Techniques. 396-404 - Adam B. Kinsman, Nicola Nicolici:
Bit-Width Allocation for Hardware Accelerators for Scientific Computing Using SAT-Modulo Theory. 405-413 - Matin Hashemi, Soheil Ghiasi:
Versatile Task Assignment for Heterogeneous Soft Dual-Processor Platforms. 414-425 - Maurizio Palesi, Shashi Kumar, Vincenzo Catania:
Leveraging Partially Faulty Links Usage for Enhancing Yield and Performance in Networks-on-Chip. 426-440 - Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. 441-453 - Irith Pomeranz, Sudhakar M. Reddy:
TOV: Sequential Test Generation by Ordering of Test Vectors. 454-465 - Debasish Das, Kip Killpack, Chandramouli V. Kashyap, Abhijit Jas, Hai Zhou:
Pessimism Reduction in Coupling-Aware Static Timing Analysis Using Timing and Logic Filtering. 466-478 - Chandan Karfa, Dipankar Sarkar, Chitta Mandal:
Verification of Datapath and Controller Generation Phase in High-Level Synthesis of Digital Circuits. 479-492 - Enric Musoll:
Hardware-Based Load Balancing for Massive Multicore Architectures Implementing Power Gating. 493-497 - Seung Hoon Choi, Kunhyuk Kang, Florentin Dartu, Kaushik Roy:
Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching. 497-502 - Irith Pomeranz, Sudhakar M. Reddy:
On Test Generation With Test Vector Improvement. 502-506
Volume 29, Number 4, April 2010
- Tejas Jhaveri, Vyacheslav Rovner, Lars Liebmann, Larry T. Pileggi, Andrzej J. Strojwas, Jason Hibbeler:
Co-Optimization of Circuits, Layout and Lithography for Predictive Technology Scaling Beyond Gratings. 509-527 - Angelo Brambilla, Giambattista Gruosso, Giancarlo Storti Gajani:
FSSA: Fast Steady-State Algorithm for the Analysis of Mixed Analog/Digital Circuits. 528-537 - Akash Kumar, Bart Mesman, Henk Corporaal, Yajun Ha:
Iterative Probabilistic Performance Prediction for Multi-Application Multiprocessor Systems. 538-551 - Tao Xu, Krishnendu Chakrabarty, Vamsee K. Pamula:
Defect-Tolerant Design and Optimization of a Digital Microfluidic Biochip for Protein Crystallization. 552-565 - Sudipta Kundu, Sorin Lerner, Rajesh K. Gupta:
Translation Validation of High-Level Synthesis. 566-579 - Jui-Hsiang Liu, Ming-Feng Tsai, Lumdo Chen, Charlie Chung-Ping Chen:
Accurate and Analytical Statistical Spatial Correlation Modeling Based on Singular Value Decomposition for VLSI DFM Applications. 580-589 - Sangho Shin, Kyungmin Kim, Sung-Mo Kang:
Compact Models for Memristors Based on Charge-Flux Constitutive Relationships. 590-598 - Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudhry, James Victory, Gennady Gildenblat:
Statistical Modeling With the PSP MOSFET Model. 599-606 - Qiang Ma, Evangeline F. Y. Young:
Multivoltage Floorplan Design. 607-617 - Katherine Shu-Min Li:
Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction Under Output Constraint. 618-626 - Rajesh Amratlal Thakker, Chaitanya Sathe, Maryam Shojaei Baghini, Mahesh B. Patil:
A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance. 627-631 - Ádám Rák, György Cserey:
Macromodeling of the Memristor in SPICE. 632-636 - Stephen Cauley, Venkataramanan Balakrishnan, Cheng-Kok Koh:
A Parallel Direct Solver for the Simulation of Large-Scale Power/Ground Networks. 636-641 - Taemin Kim, Xun Liu:
A Functional Unit and Register Binding Algorithm for Interconnect Reduction. 641-646 - Hong-Zu Chou, Kai-Hui Chang, Sy-Yen Kuo:
Accurately Handle Don't-Care Conditions in High-Level Designs and Application for Reducing Initialized Registers. 646-651
Volume 29, Number 5, May 2010
- Seungwhun Paik, Insup Shin, Taewhan Kim, Youngsoo Shin:
HLS-l: A High-Level Synthesis Framework for Latch-Based Architectures. 657-670 - Yang-Shan Tong, Sao-Jie Chen:
An Automatic Optical Simulation-Based Lithography Hotspot Fix Flow for Post-Route Optimization. 671-684 - Chin-Hsiung Hsu, Huang-Yu Chen, Yao-Wen Chang:
Multilayer Global Routing With Via and Wire Capacity Considerations. 685-696 - Kuan-Hsien Ho, Yen-Pin Chen, Jia-Wei Fang, Yao-Wen Chang:
ECO Timing Optimization Using Spare Cells and Technology Remapping. 697-710 - Jia-Wei Fang, Yao-Wen Chang:
Area-I/O Flip-Chip Routing for Chip-Package Co-Design Considering Signal Skews. 711-721 - Vivek Joshi, Brian Cline, Dennis Sylvester, David T. Blaauw, Kanak Agarwal:
Mechanical Stress Aware Optimization for Leakage Power Reduction. 722-736 - Bijan Alizadeh, Mohammad Mirzaei, Masahiro Fujita:
Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits. 737-748 - Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chandu Visweswariah:
Statistical Path Selection for At-Speed Test. 749-759 - Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits. 760-773 - Kunal P. Ganeshpure, Sandip Kundu:
On ATPG for Multiple Aggressor Crosstalk Faults. 774-787 - Nuno Alves, Alison Buben, Kundan Nepal, Jennifer Dworak, R. Iris Bahar:
A Cost Effective Approach for Online Error Detection Using Invariant Relationships. 788-801 - Yue Qian, Zhonghai Lu, Wenhua Dou:
Analysis of Worst-Case Delay Bounds for On-Chip Packet-Switching Networks. 802-815 - Sohaib Majzoub, Resve A. Saleh, Steven J. E. Wilton, Rabab K. Ward:
Energy Optimization for Many-Core Platforms: Communication and PVT Aware Voltage-Island Formation and Voltage Selection Algorithm. 816-829 - Svetozar S. Broussev, Nikolay T. Tchamov:
Time-Varying Root-Locus of Large-Signal LC Oscillators. 830-834 - Chao-Wen Tzeng, Shi-Yu Huang:
Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. 834-839 - Abraham Suissa, Olivier Romain, Julien Denoulet, Khalil Hachicha, Patrick Garda:
Empirical Method Based on Neural Networks for Analog Power Modeling. 839-844 - Chip-Hong Chang, Mathias Faust:
On "A New Common Subexpression Elimination Algorithm for Realizing Low-Complexity Higher Order Digital Filters". 844-848 - Navin Srivastava, Chuan Xu, Roberto Suaya, Kaustav Banerjee:
Corrections to "Analytical Expressions for High-Frequency VLSI Interconnect Impedance Extraction in the Presence of a Multilayer Conductive Substrate" [Jul 09 1047-1060]. 849
Volume 29, Number 6, June 2010
- Radu Marculescu, Axel Jantsch:
Guest Editorial: Special Section on the ACM/IEEE Symposium on Networks-on-Chip 2009. 853-854 - Mehdi Modarressi, Arash Tavakkol, Hamid Sarbazi-Azad:
Virtual Point-to-Point Connections for NoCs. 855-868 - Nicola Concer, Luciano Bononi, Michael Soulie, Riccardo Locatelli, Luca P. Carloni:
The Connection-Then-Credit Flow Control Protocol for Heterogeneous Multicore Systems-on-Chip. 869-882 - Adán Kohler, Gert Schley, Martin Radetzki:
Fault Tolerant Network on Chip Switching With Graceful Performance Degradation. 883-896 - Anh Thien Tran, Dean Nguyen Truong, Bevan M. Baas:
A Reconfigurable Source-Synchronous On-Chip Network for GALS Many-Core Platforms. 897-910 - Fabrizio Ferrandi, Pier Luca Lanzi, Christian Pilato, Donatella Sciuto, Antonino Tumeo:
Ant Colony Heuristic for Mapping and Scheduling Tasks and Communications on Heterogeneous Embedded Systems. 911-924 - Jorge Fernandez Villena, Luís Miguel Silveira:
SPARE - A Scalable Algorithm for Passive, Structure Preserving, Parameter-Aware Model Order Reduction. 925-938 - Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Yao:
Layout Decomposition Approaches for Double Patterning Lithography. 939-952 - Chin-Hsien Wu, Hsin-Hung Lin, Tei-Wei Kuo:
An Adaptive Flash Translation Layer for High-Performance Storage Systems. 953-965 - Zhen Chen, Dong Xiang:
A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost. 966-976 - Xiaochun Yu, Ronald D. Blanton:
Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics. 977-987 - Akhilesh Kumar, Mohab Anis:
IR-Drop Management in FPGAs. 988-993 - Xiaoxi Xu, Cheng-Chew Lim:
Modeling Interrupts for Software-Based System-on-Chip Verification. 993-997
Volume 29, Number 7, July 2010
- Krishnendu Chakrabarty, Richard B. Fair, Jun Zeng:
Design Tools for Digital Microfluidic Biochips: Toward Functional Diversification and More Than Moore. 1001-1017 - Jongeun Lee, Aviral Shrivastava:
A Compiler-Microarchitecture Hybrid Approach to Soft Error Reduction for Register Files. 1018-1027 - Soumyajit Dey, Dipankar Sarkar, Anupam Basu:
A Tag Machine Based Performance Evaluation Method for Job-Shop Schedules. 1028-1041 - Vincent Acary, Olivier Bonnefon, Bernard Brogliato:
Time-Stepping Numerical Simulation of Switched Circuits Within the Nonsmooth Dynamical Systems Approach. 1042-1055 - Janakiraman Viraraghavan, Bharadwaj Amrutur, V. Visvanathan:
Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks. 1056-1069 - Kwangok Jeong, Andrew B. Kahng, Chul-Hong Park, Hailong Yao:
Dose Map and Placement Co-Optimization for Improved Timing Yield and Leakage Power. 1070-1082 - Giovanni Beltrame, Luca Fossati, Donatella Sciuto:
Decision-Theoretic Design Space Exploration of Multiprocessor Platforms. 1083-1095 - Philip Brisk, Ajay Kumar Verma, Paolo Ienne:
An Optimal Linear-Time Algorithm for Interprocedural Register Allocation in High Level Synthesis Using SSA Form. 1096-1109 - Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak:
On Reducing Scan Shift Activity at RTL. 1110-1120 - Dani Tannir, Roni Khazaka:
Computation of Intermodulation Distortion in RF Circuits Using Single-Tone Moments Analysis. 1121-1125 - Daniel Tille, Stephan Eggersglüß, Rolf Drechsler:
Incremental Solving Techniques for SAT-based ATPG. 1125-1130 - Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang:
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. 1130-1135 - Irith Pomeranz, Sudhakar M. Reddy:
On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits. 1135-1140 - Likun Xia, Ian M. Bell, Antony J. Wilkinson:
Automated Model Generation Algorithm for High-Level Fault Modeling. 1140-1145
Volume 29, Number 8, August 2010
- Bradley N. Bond, Zohaib Mahmood, Yan Li, Ranko Sredojevic, Alexandre Megretski, Vladimir Stojanovic, Yehuda Avniel, Luca Daniel:
Compact Modeling of Nonlinear Analog Circuits Using System Identification via Semidefinite Programming and Incremental Stability Certification. 1149-1162 - Alastair M. Smith, George A. Constantinides, Peter Y. K. Cheung:
FPGA Architecture Optimization Using Geometric Programming. 1163-1176 - Yu Pang, Katarzyna Radecka, Zeljko Zilic:
Optimization of Imprecise Circuits Represented by Taylor Series and Real-Valued Polynomials. 1177-1190 - ShengYu Shen, Ying Qin, Kefei Wang, Liquan Xiao, Jianmin Zhang, Sikun Li:
Synthesizing Complementary Circuits Automatically. 1191-1202 - Zheng Zhang, Ngai Wong:
An Efficient Projector-Based Passivity Test for Descriptor Systems. 1203-1214 - Onder Suvak, Alper Demir:
Quadratic Approximations for the Isochrons of Oscillators: A General Theory, Advanced Numerical Methods, and Accurate Phase Computations. 1215-1228 - Mohit Gupta, Kwangok Jeong, Andrew B. Kahng:
Timing Yield-Aware Color Reassignment and Detailed Placement Perturbation for Bimodal CD Distribution in Double Patterning Lithography. 1229-1242 - Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu:
Built-In Self-Repair Schemes for Flash Memories. 1243-1256 - Lin Huang, Qiang Xu:
Economic Analysis of Testing Homogeneous Manycore Chips. 1257-1270