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"Gate-Sizing-Based Single Vdd Test for Bridge Defects in ..."

S. Saqib Khursheed et al. (2010)

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DOI: 10.1109/TCAD.2010.2059310

access: closed

type: Journal Article

metadata version: 2022-01-03

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S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty, Peter Harrod:
Gate-Sizing-Based Single V_dd Test for Bridge Defects in Multivoltage Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(9): 1409-1421 (2010)

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