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"A Novel Test Application Scheme for High Transition Fault Coverage and Low ..."
Zhen Chen, Dong Xiang (2010)
- Zhen Chen, Dong Xiang:
A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(6): 966-976 (2010)
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