"A Novel Test Application Scheme for High Transition Fault Coverage and Low ..."

Zhen Chen, Dong Xiang (2010)

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DOI: 10.1109/TCAD.2010.2048359

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type: Journal Article

metadata version: 2020-09-24

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Zhen Chen, Dong Xiang:
A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(6): 966-976 (2010)

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