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"Testing Random Defect and Process Variation Induced Comparison Faults of ..."

Jin-Fu Li, Yu-Jen Huang, Yong-Jyun Hu (2010)

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DOI: 10.1109/TCAD.2010.2072710

access: closed

type: Journal Article

metadata version: 2023-10-17

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Jin-Fu Li, Yu-Jen Huang, Yong-Jyun Hu:
Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(11): 1843-1847 (2010)

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