Cheng-Hong Li, Luca P. Carloni: Leveraging Local Intracore Information to Increase Global Performance in Block-Based Design of Systems-on-Chip.
165-178
Abdallatif S. Abu-Issa, Steven F. Quigley: Bit-Swapping LFSR and Scan-Chain Ordering: A Novel Technique for Peak- and Average-Power Reduction in Scan-Based BIST.
755-759
Haitao Dai, R. W. Knepper: Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology.
826-836
S. Das, Shamik Sural, Amit Patra: Resistance Estimation for Lateral Power Arrays Through Accurate Netlist Generation.
837-845
Ki Jin Han, Madhavan Swaminathan: Inductance and Resistance Calculations in Three-Dimensional Packaging Using Cylindrical Conduction-Mode Basis Functions.
846-859
Erkan Acar, Sule Ozev: Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis.
993-1005
Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan: ELIAD: Efficient Lithography Aware Detailed Routing Algorithm With Compact and Macro Post-OPC Printability Prediction.
1006-1016
S. Mukhopadhyay: A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies.
1038-1046
Navin Srivastava, Roberto Suaya, Kaustav Banerjee: Analytical Expressions for High-Frequency VLSI Interconnect Impedance Extraction in the Presence of a Multilayer Conductive Substrate.
1047-1060
Duo Chen, Dan Jiao: Time-Domain Orthogonal Finite-Element Reduction-Recovery Method for Electromagnetics-Based Analysis of Large-Scale Integrated Circuit and Package Problems.
1138-1149
Ibrahim M. Elfadel: Convergence of Transverse Waveform Relaxation for the Electrical Analysis of Very Wide Transmission Line Buses.
1150-1161
Trent McConaghy, Georges G. E. Gielen: Template-Free Symbolic Performance Modeling of Analog Circuits via Canonical-Form Functions and Genetic Programming.
1162-1175
Amith Singhee, Rob A. Rutenbar: Statistical Blockade: Very Fast Statistical Simulation and Modeling of Rare Circuit Events and Its Application to Memory Design.
1176-1189
Zhiyu Zeng, Peng Li: Locality-Driven Parallel Power Grid Optimization.
1190-1200
Qunzeng Liu, Sachin S. Sapatnekar: A Framework for Scalable Postsilicon Statistical Delay Prediction Under Process Variations.
1201-1212
Wan Yeon Lee, Hyogon Kim, Heejo Lee: Maximum-Utility Scheduling of Operation Modes With Probabilistic Task Execution Times Under Energy Constraints.
1531-1544
Sung-Boem Park, Ted Hong, Subhasish Mitra: Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA).
1545-1558
Ravishankar Rao, Sarma B. K. Vrudhula: Fast and Accurate Prediction of the Steady-State Throughput of Multicore Processors Under Thermal Constraints.
1559-1572
Nisar Ahmed, Mohammad Tehranipoor: A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects.
1573-1582
Sying-Jyan Wang, Tung-Hua Yeh: High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability.
1583-1596
Trent McConaghy, Georges G. E. Gielen: Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via Response Surfaces and Structural Homotopy.
1627-1640
Ivica Stevanovic, Colin C. McAndrew: Corrections to "Quadratic Backward Propagation of Variance for Nonlinear Statistical Circuit Modeling" [Sep 09 1428-1432].
1896