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"An Improved Soft-Error Rate Measurement Technique."

Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu (2009)

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DOI: 10.1109/TCAD.2009.2014003

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SanyalGK09
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
An Improved Soft-Error Rate Measurement Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 596-600 (2009)

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