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Hongxia Fang
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2010 – 2019
- 2012
- [j5]Hongxia Fang, Krishnendu Chakrabarty
, Zhiyuan Wang, Xinli Gu:
Reproduction and Detection of Board-Level Functional Failure. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 630-643 (2012) - [j4]Hongxia Fang, Krishnendu Chakrabarty
, Zhiyuan Wang, Xinli Gu:
Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(10): 1586-1599 (2012) - [j3]Hongxia Fang, Krishnendu Chakrabarty
, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
Functional Test-Sequence Grading at Register-Transfer Level. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1890-1894 (2012) - 2011
- [b1]Hongxia Fang:
Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards. Duke University, Durham, NC, USA, 2011 - [c6]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
:
Deterministic test for the reproduction and detection of board-level functional failures. ASP-DAC 2011: 491-496 - [c5]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
:
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. ETS 2011: 195-200 - 2010
- [j2]Hongxia Fang, Krishnendu Chakrabarty
, Hideo Fujiwara:
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. J. Electron. Test. 26(2): 151-164 (2010) - [c4]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty
:
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. Asian Test Symposium 2010: 421-428
2000 – 2009
- 2009
- [j1]Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty
, Michael Bienek:
Deviation-Based LFSR Reseeding for Test-Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 259-271 (2009) - [c3]Hongxia Fang, Krishnendu Chakrabarty
, Rubin A. Parekhji:
Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. Asian Test Symposium 2009: 331-336 - [c2]Hongxia Fang, Krishnendu Chakrabarty
, Hideo Fujiwara:
RTL DFT techniques to enhance defect coverage for functional test sequences. HLDVT 2009: 160-165 - [c1]Hongxia Fang, Krishnendu Chakrabarty
, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
RT-Level Deviation-Based Grading of Functional Test Sequences. VTS 2009: 264-269
Coauthor Index
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