"Threshold Testing: Improving Yield for Nanoscale VLSI."

Zhigang Jiang, Sandeep K. Gupta (2009)

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DOI: 10.1109/TCAD.2009.2032375

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type: Journal Article

metadata version: 2023-09-21

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Zhigang Jiang, Sandeep K. Gupta:
Threshold Testing: Improving Yield for Nanoscale VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(12): 1883-1895 (2009)

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