Jong-Yeol Lee, In-Cheol Park: Timed compiled-code functional simulation of embedded software for performance analysis of SOC design.
1-14
David J. Walkey, Dritan Celo, Tom J. Smy: A simplified model for the effect of interfinger metal on maximum temperature rise in a multifinger bipolar transistor.
15-25
Nikolay Rubanov: SubIslands: the probabilistic match assignment algorithm for subcircuit recognition.
26-38
Chun-Yao Wang, Shing-Wu Tung, Jing-Yang Jou: Automatic interconnection rectification for SoC design verification based on the port order fault model.
104-114
Michal Rewienski, Jacob K. White: A trajectory piecewise-linear approach to model order reduction and fast simulation of nonlinear circuits and micromachined devices.
155-170
Joel R. Phillips: Projection-based approaches for model reduction of weakly nonlinear, time-varying systems.
171-187
Alper Demir, Jaijeet S. Roychowdhury: A reliable and efficient procedure for oscillator PPV computation, with phase noise macromodeling applications.
188-197
Glenn Wolfe, Ranga Vemuri: Extraction and use of neural network models in automated synthesis of operational amplifiers.
198-212
Bart De Smedt, Georges G. E. Gielen: WATSON: design space boundary exploration and model generation for analog and RFIC design.
213-224
Milos Hrkic, John Lillis: Buffer tree synthesis with consideration of temporal locality, sink polarity requirements, solution cost, congestion, and blockages.
481-491
Jae-Gon Kim, Yeong-Dae Kim: A linear programming-based algorithm for floorplanning in VLSI design.
584-592
Chunsheng Liu, Krishnendu Chakrabarty: Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment.
593-604
Michael Dimopoulos, Panagiotis Linardis: Accelerating the compaction of test sequences in sequential circuits through problem size reduction.
1443-1449
Hendrik Rogier, Daniel De Zutter: A fast technique based on perfectly matched layers for the full-wave solution of 2-D dispersive microstrip lines.
1650-1656
Irith Pomeranz, Sudhakar M. Reddy: Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations.
1663-1670