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"Test generation and optimization for DRAM cell defects using electrical ..."

Zaid Al-Ars, Ad J. van de Goor (2003)

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DOI: 10.1109/TCAD.2003.818125

access: closed

type: Journal Article

metadata version: 2020-09-24

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Zaid Al-Ars, Ad J. van de Goor:
Test generation and optimization for DRAM cell defects using electrical simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(10): 1371-1384 (2003)

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