"Test data compression based on input-output dependence."

Irith Pomeranz, Sudhakar M. Reddy (2003)

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DOI: 10.1109/TCAD.2003.818122

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Test data compression based on input-output dependence. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(10): 1450-1455 (2003)

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