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"Efficient event-driven simulation by exploiting the output observability ..."

Peter M. Maurer (2003)

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DOI: 10.1109/TCAD.2003.818305

access: closed

type: Journal Article

metadata version: 2020-09-24

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Peter M. Maurer:
Efficient event-driven simulation by exploiting the output observability of gate clusters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(11): 1471-1486 (2003)

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