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"Reliability-constrained area optimization of VLSI power/ground networks ..."

Sheldon X.-D. Tan, C.-J. Richard Shi, Jyh-Chwen Lee (2003)

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DOI: 10.1109/TCAD.2003.819429

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sheldon X.-D. Tan, C.-J. Richard Shi, Jyh-Chwen Lee:
Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(12): 1678-1684 (2003)

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